There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

NIST X-ray Photoelectron Spectroscopy Database

Version 5.0

Last Update to Data Content:  2023
https://dx.doi.org/10.18434/T4T88K

Data Compiled and Evaluated
By

Alexander V. Naumkin, Anna Kraut-Vass, Stephen W. Gaarenstroom,
and Cedric J. Powell

Software Developed
By

Angela Y. Lee


Introduction:

The NIST X-ray Photoelectron Spectroscopy (XPS) Database gives easy access to the energies of many photoelectron and Auger-electron spectral lines.  Resulting from a critical evaluation of the published literature, the database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.  A highly interactive program allows the user to search by element, line type, line energy, and many other variables.  Users can easily identify unknown measured lines by matching to previous measurements.

logo for SRD 20
News:
NIST recently released a new version of the NIST Inorganic Crystal Structure Database (ICSD) SRD 3. For more information visit https://icsd.nist.gov
May 19, 2021

An error has occurred. This application may no longer respond until reloaded. Reload 🗙