Material Specification for Tl:2223; [Tl-Ba-Ca-Cu-O]
Process: Evaporation
Notes: The authors cite D.S. Ginley, et al., Physica C, Vol. 260, 42 (1989), and summarize the procedure as follows. "... films (700 mm thick) were made using e-beam evaporation with a post-sinter and oxygen anneal..."
Formula: Tl2Ba2Ca2Cu3Ox
Informal Name: Tl:2223
Chemical Family: Tl-Ba-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form: Thin Film
Surface Resistance for Tl:2223; [Tl-Ba-Ca-Cu-O]
Sample Number (No unit) |
Field Frequency (GHz) |
Surface Resistance (mΩ) |
1 |
29.3 |
5.3 |
1 |
30.8 |
5.9 |
1 |
32.0 |
6.6 |
1 |
33.4 |
7.0 |
1 |
34.8 |
7.3 |
1 |
36.2 |
8.0 |
1 |
37.5 |
8.5 |
1 |
38.9 |
9.2 |
2 |
29.3 |
6.1 |
2 |
30.6 |
7.1 |
2 |
32.1 |
7.6 |
2 |
33.4 |
7.9 |
2 |
34.8 |
8.8 |
2 |
36.2 |
9.5 |
2 |
37.5 |
10.1 |
2 |
38.9 |
10.9 |
Measurement Method: Confocal resonator
A "half confocal resonator scheme (was) used to measure sample surface resistance... The classical structure uses two spherical mirrors with the center of curvature of each mirror at the other spherical surface... We use half of this structure where the sample forms the second reflector at the midpoint of the full system... The dominant mode TEM
00n only is used in this experiment..."
Cautions: Evaluated Data
Digitized data were obtained from Figure 3 of the paper.