NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Growth and Characterization of Ba2YCu3O7-δ Films in Reduced Oxygen Partial Pressures Using the BaF2 Post- Annealing Process
Author(s): M.P. Siegal, S.Y. Hou, J.M. Phillips, T.H. Tiefel, and J.H. Marshall
Publication: Journal of Materials Research Volume: 7 Issue: 10 Year: 1992 Page(s): 2658-2666
Editor(s): Not Available
Publisher: Materials Research Society
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Temperature, Critical Current Density

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process: Evaporation
Notes: The authors cite M.P. Siegal et al., Physica C, Vol. 172, 282 (1990), and summarize the procedure as follows. "BaF2, Y, and Cu are coevaporated in a vacuum deposition chamber... Films 100-1000 σ thick are deposited onto unheated LaAlO3(100) substrates. The substrates coated with these precursor films are annealed in a gas flow tube furnace using a two-stage process for the formation of... superconducting films. The first stage is a high temperature anneal in either a gas mixture of nominally 0.5% O2 + 99.5% N2 or 100% O2 bubbled through room-temperature de-ionized H2O at temperature ranging from 600 to 1050 °C for 30 min. The second stage is the full oxygenation... to form the superconducting orthorhombic phase in 100% dry O2 at 525 °C for 30 min."
Formula: YBa2Cu3O7-x
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Temperature for Y:123; [Y-Ba-Cu-O]
Annealing Temperature (°C) Critical Temperature (K)
600 59
650 75
675 88
700 89
725 89
750 90
775 90
800 90
Measurement Method: Four-probe method
"Sheet resistances... are determined by soldering four Au leads with In to a sample surface in the van der pauw arrangement. Critical temperature (Tc) is defined as the point where R becomes ≤ 0.2 Ω."

Cautions: Evaluated Data
Digitized data were obtained from Figure 6 of the paper.
Critical Current Density for Y:123; [Y-Ba-Cu-O]
Magnetic Field (T) Test Temperature (K) Annealing Temperature (°C) Critical Current Density (kA/cm2)
0 5 649 1460
0 5 672 2725
0 5 699 19300
0 5 721 17500
0 5 747 28100
0 5 769 25600
0 5 795 41000
0 5 822 32100
0 5 845 41800
0 5 872 38200
0 5 896 36600
0 5 920 28600
0 5 653 1200
0.9 5 677 2100
0.9 5 703 12500
0.9 5 725 11900
0.9 5 751 15400
0.9 5 773 12600
0.9 5 799 13300
0.9 5 823 12700
0.9 5 847 13400
0.9 5 874 12800
0.9 5 898 11600
0.9 5 924 8100
0 77 652 20
0 77 675 150
0 77 702 1600
0 77 724 1700
0 77 747 3200
0 77 772 2200
0 77 798 4500
0 77 824 3700
0 77 846 5300
0 77 872 4400
0 77 896 4400
0 77 922 3100
0.9 77 676 40
0.9 77 702 440
0.9 77 724 460
0.9 77 748 550
0.9 77 770 370
0.9 77 796 290
0.9 77 823 260
0.9 77 847 400
0.9 77 871 380
0.9 77 895 310
0.9 77 924 210
Measurement Method: Vibrating sample magnetometer
"Jc is determined using vibrating sample magnetometer to measure the magnetization of films in fields up to 1.0 T perpendicular to the film surface. Jc values are extracted, using the critical state model, with the appropriate geometrical factors."

Cautions: Evaluated Data
Digitized data were obtained from Figure 8 of the paper.