Material Specification for Yb:124; [Yb-Ba(Sr)-Cu-O]
Process: Solid State Reaction
Notes: "The Yb(Ba1-xSrx)2Cu4Ox samples were prepared employing a conventional solid-state reaction method and a hot isostatic pressing (HIP) technique. High purity powders (99.9%) of Yb2O3, BaCO3, SrCO3 and CuO were used as starting materials... appropriate amounts of powders in the nominal compositions of Yb(Ba1-xSrx)2Cu4O8 (0.0 ≤x ≤0.5) were mixed and pressed. The lump mixtures were calcined at 900 °C for 20 h in O2 gas flow and then ground. The calcined powder was pressed into parallelepiped bars and pre-sintered at 920 °C in flowing O2 gas. The compacted bars were sintered and annealed at 1070 °C for 6 h in a mixed gas, 80% Ar+20% O2, of a high pressure of 200 MPa..."
Formula: YbBa2-xSrxCu4O8
Informal Name: Yb:124
Chemical Family: Yb-Ba(Sr)-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for Yb:124; [Yb-Ba(Sr)-Cu-O]
Crystal System: | Orthorhombic |
Formula Units per Cell: | |
Space Group: |
|
Cell Parameters
x of Srx (formula units) |
Temp
K
|
a
Å
|
b
Å
|
c
Å
|
0.2 |
296 |
3.814(1) |
3.857(1) |
27.129(1) |
0.4 |
296 |
3.805(1) |
3.855(1) |
27.072(1) |
0.6 |
296 |
3.796(1) |
3.851(1) |
27.022(1) |
0.8 |
296 |
3.794(1) |
3.851(1) |
27.007(1) |
Measurement Method: X-ray diffraction
"The lattice parameters were determined by X-ray powder diffraction using CuK
α radiation." No additional measurement details were noted.
Cautions: Unevaluated Data
Critical Temperature for Yb:124; [Yb-Ba(Sr)-Cu-O]
x of Srx (formula units) |
Tc(magnetic) (K) |
Tc(onset) (K) |
Critical Temperature (K) |
0.2 |
80 |
82 |
77 |
0.4 |
80 |
83 |
78 |
0.6 |
80 |
83 |
77 |
0.8 |
80 |
81 |
76 |
Measurement Method: Four-probe method
"The electrical resistivity of the samples were measured by a conventional DC four-probe method." No additional measurement details were noted.
Cautions: Unevaluated Data
Resistivity (normal state) for Yb:124; [Yb-Ba(Sr)-Cu-O]
x of Srx (formula units) |
Temperature (K) |
Resistivity (normal state) (mΩ·cm) |
0.2 |
50 |
0.0 |
0.2 |
77 |
0.0 |
0.2 |
81 |
0.6 |
0.2 |
84 |
1.2 |
0.2 |
125 |
2.0 |
0.2 |
175 |
2.9 |
0.2 |
225 |
3.5 |
0.2 |
275 |
4.0 |
0.4 |
50 |
0.0 |
0.4 |
78 |
0.0 |
0.4 |
83 |
0.8 |
0.4 |
125 |
1.3 |
0.4 |
175 |
1.9 |
0.4 |
225 |
2.2 |
0.4 |
275 |
2.7 |
0.6 |
50 |
0.0 |
0.6 |
77 |
0.0 |
0.6 |
81 |
1.2 |
0.6 |
125 |
2.0 |
0.6 |
175 |
2.7 |
0.6 |
225 |
3.2 |
0.6 |
275 |
3.8 |
0.8 |
50 |
0.0 |
0.8 |
76 |
0.0 |
0.8 |
81 |
2.0 |
0.8 |
84 |
2.3 |
0.8 |
125 |
3.6 |
0.8 |
175 |
4.7 |
0.8 |
225 |
5.6 |
0.8 |
275 |
6.4 |
Measurement Method: Four-probe method
"The electrical resistivity of the samples were measured by a conventional DC four-probe method." No additional measurement details were noted.
Cautions: Unevaluated Data
Digitized data were obtained from Figure 3 of the paper.
Magnetic Susceptibility for Yb:124; [Yb-Ba(Sr)-Cu-O]
x of Srx (formula units) |
Temperature (K) |
Magnetic Susceptibility (arbitrary) |
0.2 |
5 |
-0.0047 |
0.2 |
20 |
-0.0046 |
0.2 |
40 |
-0.0047 |
0.2 |
60 |
-0.0047 |
0.2 |
72 |
-0.0044 |
0.2 |
76 |
-0.0031 |
0.2 |
78 |
-0.0013 |
0.2 |
81 |
0.0000 |
0.2 |
100 |
0.0000 |
0.4 |
4 |
-0.0049 |
0.4 |
20 |
-0.0049 |
0.4 |
40 |
-0.0049 |
0.4 |
60 |
-0.0049 |
0.4 |
74 |
-0.0042 |
0.4 |
78 |
-0.0018 |
0.4 |
81 |
0.0000 |
0.4 |
90 |
0.0000 |
0.4 |
100 |
0.0000 |
0.6 |
5 |
-0.0041 |
0.6 |
21 |
-0.0041 |
0.6 |
40 |
-0.0041 |
0.6 |
60 |
-0.0041 |
0.6 |
74 |
-0.0035 |
0.6 |
78 |
-0.0013 |
0.6 |
80 |
0.0000 |
0.6 |
100 |
0.0000 |
0.8 |
5 |
-0.0030 |
0.8 |
21 |
-0.0030 |
0.8 |
40 |
-0.0030 |
0.8 |
60 |
-0.0030 |
0.8 |
74 |
-0.0021 |
0.8 |
78 |
-0.0003 |
0.8 |
80 |
0.0000 |
0.8 |
100 |
0.0000 |
Measurement Method: SQUID magnetometer
"The DC magnetic susceptibility measurements were carried out using a SQUID magnetometer." No additional measurement details were noted.
Cautions: Unevaluated Data
Digitized data were obtained from Figure 4 of the data.