NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Effect of Single Crystal Substrates on the Growth and Properties of Superconducting Tl2Ba2CaCu2O8 Films
Author(s): W.L. Holstein, L.A. Parisi, R.B. Flippen, and D. G. Swartzfager
Publication: Journal of Materials Research Volume: 8 Issue: 5 Year: 1993 Page(s): 962-972
Editor(s): Not Available
Publisher: Materials Research Society
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Temperature

Materials and Properties

Tl:2212; [Tl-Ba-Ca-Cu-O]<
Material Specification for Tl:2212; [Tl-Ba-Ca-Cu-O] Process: Solid State Reaction
Notes: "Precursor films were simultaneously deposited on the different substrates by off-axis rf magnetron sputtering of a stoichiometric 2:1:2 Ba:Ca:Cu oxide target in (0.67 Pa = 5 mTorr) argon. Precursor films of thickness about 0.9 µm were prepared. The BaCaCu oxide precursor films were thallinated in air for 10 min at 850 °C in the presence of a powder mixture of Tl2Ba2Ca2Cu3O10 and Tl2O3 contained in a covered alumina crucible. Following thallination, the Tl2Ba2CaCu2O8 film thickness was about 1.0 µm."
Formula: Tl2Ba2CaCu2O8
Informal Name: Tl:2212
Chemical Family: Tl-Ba-Ca-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form: Thin Film

Critical Temperature for Tl:2212; [Tl-Ba-Ca-Cu-O]
Substrate () Substrate's Structure () Critical Temperature (K)
MgO Cubic 103
SrTiO3 Cubic 101
LaAlO3 Rhombohedr 103
NdGaO3 Orthorhomb 99
LaGaO3 Orthorhomb 94
Al2O3 Rhombohedr 94
Measurement Method: Eddy current technique
The authors cite J.D. Doss et al., Rev. Sci. Instrum., Vol. 61, 2200 (1990), and summarize the procedure as follows. "The Tc of the films was measured inductively with the eddy current technique. A change in the ac surface resistance of the film at about 25 MHz results in a change in inductance, which in turn results in a change in the resonant frequency of a circuit."

Cautions: Evaluated Data