Material Specification for Bi:2212; [Bi-Sr-Ca-Cu-O]
Process: Flux Growth
Notes: The authors cite A. Ono, Jpn. J. Appl. Phys., Vol. 67, L1213 (1988), and summarize the procedure as follows. "Single crystals... were prepared following the modified-flux technique... After mixing appropriate amounts of the constituents, several tablets of the mixture were prepared. These tablets were stacked inside a gold crucible with a hole at the bottom, which was placed inside another gold crucible. The ensemble of these two crucibles was placed in an oven, whose temperature was gradually raised to 850 °C over a period of 24 h, and then again to 885 °C in 48 h, at which temperature the samples were maintained for 24 h, then slowly cooled to 500 °C in 72 h."
Formula: Bi2Sr2CaCu2O8+x
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for Bi:2212; [Bi-Sr-Ca-Cu-O]
| Crystal System: | Tetragonal |
| Formula Units per Cell: | |
| Space Group: |
|
Cell Parameters
|
Temp
K
|
a
Å
|
b
Å
|
c
Å
|
| 296 |
3.56 |
-- |
30.73 |
Measurement Method: X-ray diffraction
Cautions: Unevaluated Data
No measurement details were noted.
Critical Temperature for Bi:2212; [Bi-Sr-Ca-Cu-O]
| Critical Temperature (K) |
| 84 |
Measurement Method: Four-probe method
Cautions: Unevaluated Data
No measurement details were noted.
Critical Flux Density Hc1 for Bi:2212; [Bi-Sr-Ca-Cu-O]
| Temperature (K) |
Crit.Mag.Flux Density Hc1 (mT) |
| 1.8 |
5.0 |
| 2.3 |
4.5 |
| 3.9 |
4.0 |
| 5.5 |
3.7 |
| 21.0 |
3.0 |
| 35.0 |
2.7 |
| 60.0 |
2.0 |
| 70.0 |
1.8 |
Measurement Method: Microwave absorption
"A Varian V4502 X-band spectrometer along with a Varian 12-inch magnet controlled by a Bruker (B-H15) field controller and a Bruker power supply (B-MN50/200) were employed for the present measurements. The low-temperature measurements were performed in a cryostat, with a temperature stabilization of ±0.1 K. The first derivative of the EPR absorption signal... as obtained by the use of a modulation frequency of 100 kHz, was recorded as a function of the orientation and intensity of the external magnetic field... The thin crystal samples with area... 1x1 mm
2 and thickness of a few microns were placed at the center of a rectangular TE
102 cavity, so that there was present only the microwave magnetic field at the sample (microwave electric field being zero), with the c-axis of the samples being oriented parallel (horizontal) and perpendicular (vertical) to the direction of the microwave magnetic field (horizontal). The value of the magnetic field at which the maximum of the microwave-absorption peak occurs at low fields... designated the lower critical field."
Cautions: Evaluated Data
Digitized data were obtained from Figure 6 of the paper.
