NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Uniaxial Pressure Dependence of Tc of Single Crystalline YBa2Cu4O8 via Thermal Expansion
Author(s): C. Meingast, J. Karpinski, E. Jilek, and E. Kaldis
Publication: Physica C Volume: 209 Issue: Not Available Year: 1993 Page(s): 591-596
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Temperature, Thermal Expansion

Materials and Properties

Y:124; [Y-Ba-Cu-O]
Material Specification for Y:124; [Y-Ba-Cu-O] Process: Crystal Growth
Notes: The authors cite J. Karpinski et al., Physica C, Vol. 160, 449 (1989), and summarize the procedure as follows. "The... single crystal was grown at high oxygen pressure (0.27 GPa) at 1170 °C... The dimensions of the crystal were... 0.7 x 0.6 x 0.2 mm3, along the a-, b-, and c-axes, respectively."
Formula: YBa2Cu4O8
Informal Name: Y:124
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Temperature for Y:124; [Y-Ba-Cu-O]
Critical Temperature (K)
73 ± 1.5
Measurement Method: SQUID magnetometer
"Tc was determined with a DC SQUID magnetometer." No additional measurement details were noted.

Cautions: Unevaluated Data
Thermal Expansion for Y:124; [Y-Ba-Cu-O]
Axis () Temperature (K) Thermal Expansion (10-6 K-1)
a-axis 5 0.3
a-axis 57 2.9
a-axis 116 4.7
a-axis 173 6.1
a-axis 224 7.3
a-axis 265 8.0
a-axis 288 7.6
a-axis 300 7.2
b-axis 8 0.0
b-axis 15 0.0
b-axis 48 0.0
b-axis 100 1.5
b-axis 185 5.5
b-axis 239 7.2
b-axis 285 7.6
b-axis 300 7.2
c-axis 5 0.3
c-axis 50 5.8
c-axis 100 9.7
c-axis 153 14.0
c-axis 203 18.1
c-axis 215 16.9
c-axis 236 17.7
c-axis 259 18.8
c-axis 269 19.3
c-axis 277 18.4
c-axis 289 18.6
c-axis 300 17.7
Measurement Method: Capacitance dilatometer
The authors cite C. Meingast et al., Phys. Rev. B, Vol. 41, 11299 (1990), and summarize the procedure as follows. "The expansivity, α(T)=dln L/dT, was measured with an ultrahigh resolution capacitance dilatometer. Due to the, for dilatometry, very small size of the sample, several heating and cooling cycles near Tc were required in order to obtain smooth and reproducible results of the very small changes in expansion at Tc." No additional measurement details were noted.

Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.