NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: The Transport Properties of YBa2Cu3O7-x thin films
Author(s): C.C. Chin and T. Morishita
Publication: Physica C Volume: 207 Issue: Not Available Year: 1993 Page(s): 37-43
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Temperature, Critical Flux Density Hc2

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process: Laser Ablation
Notes: "... SrTiO3... substrates were ultrasonically cleaned in acetone and methanol. The substrates were then annealed in oxygen atmosphere at 700 °C for one hour. The mean laser energy density was calculated to be about 3 J/cm2, and the O2 deposition partial pressure was (29.3 Pa = 220 mTorr). The thickness of the ultrathin films was calibrated by the number of shots. (The thickness of sample D noted here was 750 σ.) X-ray diffraction pattern shows that the film is c-axis orientated."
Formula: YBa2Cu3O7-x
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Temperature for Y:123; [Y-Ba-Cu-O]
ΔTc (10%-90%) (K) Critical Temperature (K)
0.5 87.6
Measurement Method: Four-probe method
"The DC magnetic field was provided by a superconducting magnet. The resistance was measured by the standard four-points method. The current was provided by a constant current source, and the voltage was measured by a nano-voltmeter. The measured voltage was averaged by reversing the current to cancel out any small offset bias voltage." No additional measurement details were noted.

Cautions: Evaluated Data
Critical Flux Density Hc2 for Y:123; [Y-Ba-Cu-O]
Field Direction () Temperature (K) Crit.Mag.Flux Density Hc2 (T)
//c 81.9 9.9
//c 82.7 8.9
//c 83.6 8.9
//c 83.5 8.1
//c 83.7 7.4
//c 84.4 7.8
//c 85.2 6.9
//c 85.2 5.9
//c 86.2 3.9
//c 87.4 2.9
//c 87.4 2.4
//c 88.2 1.4
//c 88.2 0.2
//ab 87.8 9.8
//ab 87.7 9.0
//ab 88.1 7.9
//ab 87.9 7.0
//ab 88.2 3.9
//ab 88.5 2.9
//ab 88.9 2.0
//ab 88.5 1.4
//ab 88.7 0.9
//ab 88.2 0.2
Measurement Method: Four-probe method
"The DC magnetic field was provided by a superconducting magnet. The resistance was measured by the standard four-points method. The current was provided by a constant current source, and the voltage was measured by a nano-voltmeter. The measured voltage was averaged by reversing the current to cancel out any small offset bias voltage." No additional measurement details were noted.

Cautions: Evaluated Data
Digitized data were obtained from Figure 5 of the paper.