NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: A New High-Temperature Superconductor: Bi2Sr3-xCaxCu2O8+y
Author(s): M.A. Subramanian, C.C. Torardi, J.C. Calabrese, J. Gopalakrishnan, K.J. Morrissey, T.R. Askew, et al.
Publication: Science Volume: 239 Issue: Not Available Year: 1988 Page(s): 1015-1017
Editor(s): Not Available
Publisher: American Association for the Advancement of Science
Language: English
Notes: et al. = R.B. Flippen, U. Chowdhry, and A.W. Sleight
Keywords: Material Specification, Density (mass), Crystallography, Critical Temperature

Materials and Properties

Bi:2212; [Bi-Sr-Ca-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca-Cu-O] Process: Solid State Reaction
Notes: "Single crystals of the superconducting phase were grown from a Bi:Sr:Ca:Cu=2:2:1:3 oxide mixture in a gold crucible. The mixture was heated to 850°C to 900 °C, held for 36 h and cooled at the rate of 1 °C/min. Plate-like crystals that exhibited cleavage in the basal plnae... were mechanically separated... and used for further characterization and structure determination."
Formula: Bi2Sr2.33Ca0.67Cu2O8+x
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:


Density (mass) for Bi:2212; [Bi-Sr-Ca-Cu-O]
Density (g cm-3)
6.70
Measurement Method: X-ray diffraction
"The data were taken with an Enraf-Nonius CAD4 diffractometer that used MoKα monochromatic radiation. The instrument was operated in the (omega) scan mode over a 2θ range of 0 to 50 degrees. The absorption correction was determined analytically."

Cautions: Unevaluated Data
Crystallography for Bi:2212; [Bi-Sr-Ca-Cu-O]
Crystal System: Orthorhombic
Formula Units per Cell:
Space Group: Amaa
Cell Parameters
Temp K a Å b Å c Å
296 5.399(2) 5.414(1) 30.904(16)
Atomic Coordinates
Atom Temp K a-axis b-axis c-axis
Bi(1) 296 0.50 0.2278(5) 0.0523(1)
Sr(1) 296 0.00 0.2523(12) 0.1408(3)
Ca(1) 296 0.00 0.25 0.25
Cu(1) 296 0.50 0.2501(15) 0.1974(3)
O(1) 296 0.75 0.00 0.2005(15)
O(2) 296 0.25 0.50 0.1953(19)
Measurement Method: X-ray diffraction
"The data were taken with an Enraf-Nonius CAD4 diffractometer that used MoKα monochromatic radiation. The instrument was operated in the (omega) scan mode over a 2θ range of 0 to 50 degrees. The absorption correction was determined analytically."

Cautions: Evaluated Data
Critical Temperature for Bi:2212; [Bi-Sr-Ca-Cu-O]
Critical Temperature (K)
95
Measurement Method: Electrical resistivity

Cautions: Unevaluated Data
No measurement details were noted.