NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Superconductivity Near Liquid Nitrogen Temperature in the Pb-Sr-R-Ca-Cu-O System (R=Y or Rare Earth)
Author(s): M.A. Subramanian, J. Gopalakrishnan, C.C. Torardi, P.L. Gai, E.D. Boyes, T.R. Askew, R.B. Flippen, W.E. Farneth et al.
Publication: Physica C Volume: 157 Issue: Not Available Year: 1989 Page(s): 124-130
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: et al. = A.W. Sleight
Keywords: Material Specification, Density (mass), Crystallography

Materials and Properties

PbSr:2213; [Pb-Sr-Y(Ca)-Cu-O]
Material Specification for PbSr:2213; [Pb-Sr-Y(Ca)-Cu-O] Process: Solid State Reaction
Notes: "We prepared several compositions by simply reacting PbO2/PbO, SrO2, CaO2/R2O3 and CuO in sealed gold tubes around 950 °C for 12-48 h. Single crystals were grown using CuO-rich melts in sealed gold tubes with the above reagents. Plate-like crystals were mechanically separated from the melts ..."
Formula: Pb2Sr2Y0.75Ca0.25Cu3O8
Informal Name: PbSr:2213
Chemical Family: Pb-Sr-Y(Ca)-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Density (mass) for PbSr:2213; [Pb-Sr-Y(Ca)-Cu-O]
Density (g cm-3)
7.14
Measurement Method: X-ray diffraction
"... structures were determined from single crystal X-ray diffraction data." Diffractometer: Enraf-Nonius CAD4 Radiation: MoKα Monochromator: Graphite 2θ range: 0° - 60°

Cautions: Evaluated Data
Crystallography for PbSr:2213; [Pb-Sr-Y(Ca)-Cu-O]
Crystal System: Tetragonal
Formula Units per Cell: 1
Space Group: P4/mmm
Cell Parameters
Temp K a Å b Å c Å
296 3.813(2) -- 15.76(1)
Atomic Coordinates
Atom Temp K a-axis b-axis c-axis
Pb(1) 296 0.50 0.50 0.3874(1)
Y(1) 296 0.00 0.00 0.00
Sr(1) 296 0.00 0.00 0.2206(3)
Cu(1) 296 0.50 0.50 0.1070(4)
Cu(2) 296 0.00 0.00 0.50
O(1) 296 0.00 0.50 0.096(1)
O(2) 296 0.50 0.50 0.249(2)
O(3) 296 0.12(1) 0.00 0.384(3)
Measurement Method: X-ray diffraction
"... structures were determined from single crystal X-ray diffraction data." Diffractometer: Enraf-Nonius CAD4 Radiation: MoKα Monochromator: Graphite 2θ range: 0° - 60°

Cautions: Evaluated Data