NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Upper Critical Field and Normal-State Properties of Single- Phase Y1-xPrxBa2Cu3O7-δ Compounds
Author(s): J.P. Peng, P. Klavins, R.N. Shelton, H.B. Radousky, P.A. Hahn, and L. Bernardez
Publication: Physical Review B Volume: 40 Issue: 7 Year: 1989 Page(s): 4517-4526
Editor(s): Not Available
Publisher: American Physical Society
Language: English
Notes: Not Available
Keywords: Material Specification, Crystallography, Critical Temperature, Magnetic Susceptibility, Critical Field Strength Hc2

Materials and Properties

Y:123; [Y(Pr)-Ba-Cu-O]
Material Specification for Y:123; [Y(Pr)-Ba-Cu-O] Process: Solid State Reaction
Notes: "Starting from high-purity Y2O3, BaO, CuO, and Pr6O11, the powders were mixed and fired in air at 975 °C for about 50 h. The powders were cooled to room temperature at air quenching. Next, the powders were reground and fired at 1000-1010 °C for 48 h with several intermediate regrindings. The loose powder was then pressed into pellet and annealed in flowing oxygen for two hours at 975 °C, before furnace cooling to 400 °C. The pellet was finally annealed in flowing oxygen at 400 °C for 24 h followed by furnace cooling to room temperature... The oxygen content of all materials was determined by thermogravimetric analysis (TGA), using a Dupont 951 TGA system. The typical starting sample mass was approximately 50 mg, with a balance resolution of 2 µg. A single scan involved flowing forming gas (6 at.% H2, 94 at.% N2) through the sample chamber and ramping the temperature from 30 °C to 1000 °C at a rate of 5 °C/min. Oxygen loss was observed as early as 400 °C with mass loss saturating by 900 °C."
Formula: Y1-xPrxBa2Cu3Oy
Informal Name: Y:123
Chemical Family: Y(Pr)-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for Y:123; [Y(Pr)-Ba-Cu-O]
Crystal System: Orthorhombic
Formula Units per Cell:
Space Group:
Cell Parameters
x of Prx (formula units) y of Oy (formula units) Temp K a Å b Å c Å
0.0 6.96 296 3.831 3.875 11.646
0.1 6.91 296 3.839 3.879 11.668
0.2 6.91 296 3.845 3.879 11.662
0.3 6.88 296 3.847 3.883 11.672
0.35 7.01 296 3.857 3.882 11.652
0.4 6.90 296 3.856 3.882 11.662
0.45 7.01 296 3.859 3.882 11.655
0.5 7.01 296 3.868 3.888 11.669
0.6 7.03 296 3.867 3.889 11.682
0.7 7.03 296 3.874 3.892 11.686
0.9 7.03 296 3.892 3.892 11.675
1.0 6.96 296 3.896 3.896 11.688
Measurement Method: X-ray diffraction
"Powder x-ray diffraction data were taken for all samples... using CuKα radiation at room temperature. The lattice parameters were calculated from the diffraction peak positions by the method of least squares." No additional measurement details were noted.

Cautions: Evaluated Data
Critical Temperature for Y:123; [Y(Pr)-Ba-Cu-O]
x of Prx (formula units) y of Oy (formula units) ΔTc (K) Critical Temperature (K)
0.0 6.96 2.0 88.5
0.1 6.91 9.8 81.0
0.2 6.91 8.3 62.7
0.3 6.88 9.2 47.5
0.35 7.01 10.8 44.5
0.4 6.90 7.0 32.0
0.45 7.01 9.6 29.2
Measurement Method: Four-probe method
"Electrical resistivity...measurements were performed on rectangular specimens cut from sintered pellets employing the standard dc four-probe technique with silver paint contacts attached electrical leads." No additional measurement details were noted.

Cautions: Evaluated Data
Magnetic Susceptibility for Y:123; [Y(Pr)-Ba-Cu-O]
x of Prx (formula units) Temperature (K) Magnetic Susceptibility (arbitrary)
0.0 7 -4.3
0.0 20 -4.4
0.0 30 -4.4
0.0 40 -4.5
0.0 60 -4.5
0.0 70 -4.6
0.0 81 -4.3
0.0 87 -3.2
0.0 89 -1.6
0.0 91 0.0
0.0 110 0.0
0.10 5 -2.2
0.10 21 -2.2
0.10 32 -2.3
0.10 41 -2.3
0.10 51 -2.4
0.10 61 -2.3
0.10 69 -2.0
0.10 75 -1.3
0.10 77 -0.6
0.10 81 0.0
0.10 90 0.0
0.20 6 -2.6
0.20 21 -2.6
0.20 33 -2.7
0.20 43 -2.6
0.20 54 -2.1
0.20 57 -0.8
0.20 59 -0.2
0.20 65 0.0
0.20 80 0.0
0.30 7 -3.0
0.30 27 -3.0
0.30 38 -2.5
0.30 43 -1.6
0.30 47 -0.4
0.30 49 -0.1
0.30 53 0.0
0.30 70 0.0
0.35 7 -3.1
0.35 22 -3.0
0.35 33 -2.5
0.35 39 -1.1
0.35 43 -0.1
0.35 47 0.0
0.35 60 0.0
0.45 6 -1.2
0.45 13 -1.2
0.45 17 -0.9
0.45 23 -0.2
0.45 25 0.0
0.45 40 0.0
Measurement Method: SQUID magnetometer
"The dc magnetic susceptibility for each sample was measured with a superconducting quantum reference device (SQUID) magnetometer (Quantum Design)... A field of (796 kA/m = 10 Oe) was used... The upper critical field H up to (3.98 MA/m = 50 kOe) was measured magnetically with the SQUID magnetometer... The upper-critical-field H was defined as the field where the magnetization M reaches the paramagnetic value at the corresponding temperature... H was taken as the value where the measured magnetization deviates from the high-field straight lines..."

Cautions: Evaluated Data
Digitized data were obtained from Figure 2 of the paper.
Critical Field Strength Hc2 for Y:123; [Y(Pr)-Ba-Cu-O]
x of Prx (formula unit) Temperature (K) Crit.Mag.Field Strength Hc2 (MA/m)
0.0 88.5 4.00
0.0 88.6 3.17
0.0 88.9 2.37
0.0 89.5 0.81
0.0 90.8 0.006
0.10 74.9 3.42
0.10 76.3 3.40
0.10 77.0 2.96
0.10 77.6 2.38
0.10 78.3 2.28
0.10 78.6 1.64
0.20 57.2 3.38
0.20 58.3 3.07
0.20 59.6 2.26
0.20 60.2 1.48
0.20 61.8 0.02
0.30 4.5 3.04
0.30 7.3 2.41
0.30 15.1 3.04
0.30 25.4 3.50
0.30 30.0 3.49
0.30 38.1 3.10
0.30 40.2 3.08
0.30 44.4 2.34
0.30 48.8 0.32
0.30 50.5 0.02
0.35 4.5 3.04
0.35 7.7 2.36
0.35 10.1 2.14
0.35 20.4 2.55
0.35 25.0 2.62
0.35 27.8 2.69
0.35 29.6 2.71
0.35 35.5 1.86
0.35 37.3 1.61
0.35 38.7 1.52
0.35 39.6 0.66
0.35 41.7 0.03
0.40 5.0 0.66
0.40 10.0 0.92
0.40 14.2 1.11
0.40 20.3 1.38
0.40 22.4 1.40
0.40 25.2 1.28
0.40 27.3 0.99
0.40 28.7 0.57
0.40 30.0 0.01
0.45 4.6 0.46
0.45 7.5 0.53
0.45 11.7 0.60
0.45 15.3 0.65
0.45 17.7 0.58
0.45 20.5 0.48
0.45 23.7 0.26
0.45 25.1 0.00
Measurement Method: SQUID magnetometer
"The dc magnetic susceptibility for each sample was measured with a superconducting quantum reference device (SQUID) magnetometer (Quantum Design)... A field of (796 kA/m = 10 Oe) was used... The upper critical field H up to (3.98 MA/m = 50 kOe) was measured magnetically with the SQUID magnetometer... The upper-critical-field H was defined as the field where the magnetization M reaches the paramagnetic value at the corresponding temperature... H was taken as the value where the measured magnetization deviates from the high-field straight lines..."

Cautions: Evaluated Data
Digitized data were obtained from Figure 7 of the paper.