Material Specification for Y:123; [Y-Ba-Cu(Al)-O]
Process: Melt Processed
Notes: The authors cite L.F. Schneemeyer et al., Nature, August 15, 1987, and summarize the procedure as follows. "Single crystals were grown from barium oxide-copper oxide partial melts contained in Al2O3 crucibles..."
Formula: YBa2Cu3-xAlxO7-y
Informal Name: Y:123
Chemical Family: Y-Ba-Cu(Al)-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for Y:123; [Y-Ba-Cu(Al)-O]
Crystal System: | Tetragonal |
Formula Units per Cell: | 1 |
Space Group: |
P4/mmm
|
Cell Parameters
x of Alx (formula units) |
Occupancy () |
Temp
K
|
a
Å
|
b
Å
|
c
Å
|
0.22 |
-- |
296 |
3.8637(2) |
-- |
11.7231(7) |
Atomic Coordinates
x of Alx (formula units) |
Occupancy () |
Atom |
Temp
K
|
a-axis |
b-axis |
c-axis |
0.22 |
-- |
Ba |
296 |
0.5 |
0.5 |
0.19016(8) |
0.22 |
-- |
Y |
296 |
0.5 |
0.5 |
0.5 |
0.22 |
0.78(3) |
Cu(1) |
296 |
0 |
0 |
0 |
0.22 |
0.22(3) |
Al |
296 |
0 |
0 |
0 |
0.22 |
-- |
Cu(2) |
296 |
0 |
0 |
0.3587(2) |
0.22 |
-- |
O(1) |
296 |
0 |
0 |
0.155(1) |
0.22 |
-- |
O(2) |
296 |
0.5 |
0 |
0.3797(7) |
0.22 |
0.21(3) |
O(3) |
296 |
0 |
0.5 |
0 |
Measurement Method: X-ray diffraction
"The crystals were measured using a Nonius CAD-4 k-axis diffractometer with MoKα radiation, driven by the NRCCAD diffractomer package. Lattice parameters were determined by measuring absolute 2θ values of at least 25 reflections with 2θ > 50°, where Kα
1 and Kα
2 are separated. More than 600 reflections were collected for each crystal measured and corrected for absorption. Atomic positions were determined using the NRCVAX crystal structure program."
Cautions: Evaluated Data
The authors indicate the refined stoichiometry for this crystal to be
YBa
2Cu
2.78Al
0.22O
6.4.
Critical Temperature for Y:123; [Y-Ba-Cu(Al)-O]
x of Alx (formula units) |
Critical Temperature (K) |
0.000 |
92 |
0.100 |
74 |
0.112 |
82 |
0.127 |
51 |
0.131 |
45 |
0.136 |
42 |
0.161 |
20 |
0.210 |
0 |
Measurement Method: Dc magnetic susceptibility
Cautions: Unevaluated Data
No measurement details were noted.
Digitized data were obtained from Figure 1 of the paper.