Material Specification for Bi:2212; [Bi-Sr-Ca(Eu)-Cu-O]
Process: Solid State Reaction
Notes: "The samples of Bi2Sr2Ca1-xMxCu2O8+y (M = Eu, Dy, Tm) for 0 ≤x ≤0.6 were prepared by solid state reaction of appropriate quantities of well mixed metal oxides and carbonates with 4N purity. The calcination was carried out at 820 °C, 830 °C and 840 °C each for 12 h followed by furnace cooling to room temperature with intermediate grinding. Reacted materials were pulverized and cold pressed into three sets of rectangular pellets suitable for resistivity measurements. The first set of pellets was partially melted at 930 °C to 960 °C with increasing x (dopant concentration), and then reacted at 960 °C in air quenched to room temperature... The second set was annealed in O2 flow at a temperature of 860 °C for 12 h and then furnace cooled to room temperature over a span of 6 h. The third set was the same as above except that it was further annealed in flowing N2 at 600 °C for 12 h and then furnace cooled to room temperature over a span of 5 h."
Formula: Bi2Sr2Ca1-xEuxCu2O8+y
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca(Eu)-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Critical Temperature for Bi:2212; [Bi-Sr-Ca(Eu)-Cu-O]
Processing Condition () |
x (formula units) |
Tc(onset) (K) |
Critical Temperature (K) |
quenched |
0 |
99 |
90 |
quenched |
0.1 |
97 |
83 |
quenched |
0.2 |
95 |
70 |
quenched |
0.3 |
94 |
60 |
quenched |
0.4 |
98 |
45 |
quenched |
0.5 |
95 |
28 |
O2 anneal |
0 |
78 |
69 |
O2 anneal |
0.1 |
96 |
70 |
O2 anneal |
0.2 |
85 |
68 |
O2 anneal |
0.3 |
90 |
67 |
O2 anneal |
0.4 |
96 |
60 |
O2 anneal |
0.5 |
95 |
50 |
O2 anneal |
0.6 |
60 |
09 |
N2 anneal |
0 |
81 |
76 |
N2 anneal |
0.1 |
86 |
70 |
N2 anneal |
0.2 |
94 |
64 |
N2 anneal |
0.3 |
97 |
60 |
N2 anneal |
0.4 |
97 |
45 |
N2 anneal |
0.5 |
92 |
28 |
Measurement Method: Four-probe method
"The DC-resistivity of the rectangular slab samples was obtained in the temperature range 4.2-300 K by the conventional four-probe technique. The temperature of the samples was monitored using a standard PRT of 100 Ω in conjunction with a Keithley 195A DMM with an accuracy of ±0.1 K in the temperature range of 70-300 K. A liquid He cryostat with a Ge temperature sensor was used for the temperature range of 4.2-70 K. The entire measurement system comprising the nanovoltmeter, constant current source and temperature controller and indicator, was hooked onto a HP216 system controller for automatic data acquisition and control."
Cautions: Evaluated Data
Material Specification for Bi:2212; [Bi-Sr-Ca(Dy)-Cu-O]
Process: Solid State Reaction
Notes: "The samples of Bi2Sr2Ca1-xMxCu2O8+y (M = Eu, Dy, Tm) for 0 ≤x ≤0.6 were prepared by solid state reaction of appropriate quantities of well mixed metal oxides and carbonates with 4N purity. The calcination was carried out at 820 °C, 830 °C and 840 °C each for 12 h followed by furnace cooling to room temperature with intermediate grinding. Reacted materials were pulverized and cold pressed into three sets of rectangular pellets suitable for resistivity measurements. The first set of pellets was partially melted at 930 °C to 960 °C with increasing x (dopant concentration), and then reacted at 960 °C in air quenched to room temperature... The second set was annealed in O2 flow at a temperature of 860 °C for 12 h and then furnace cooled to room temperature over a span of 6 h. The third set was the same as above except that it was further annealed in flowing N2 at 600 °C for 12 h and then furnace cooled to room temperature over a span of 5 h."
Formula: Bi2Sr2Ca1-xDyxCu2O8+y
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca(Dy)-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for Bi:2212; [Bi-Sr-Ca(Dy)-Cu-O]
Crystal System: | Tetragonal |
Formula Units per Cell: | |
Space Group: |
|
Cell Parameters
x (formula units) |
Temp
K
|
a
Å
|
b
Å
|
c
Å
|
0.0 |
296 |
5.39 |
-- |
30.73 |
0.1 |
296 |
5.39 |
-- |
30.70 |
0.3 |
296 |
5.38 |
-- |
30.63 |
0.4 |
296 |
5.38 |
-- |
30.61 |
0.5 |
296 |
5.37 |
-- |
30.59 |
0.6 |
296 |
5.37 |
-- |
30.54 |
Measurement Method: X-ray diffraction
"XRD-patterns using CuKα radiation were recorded at room temperature..." No additional measurement details were noted.
Cautions: Unevaluated Data
Critical Temperature for Bi:2212; [Bi-Sr-Ca(Dy)-Cu-O]
Processing Condition () |
x (formula units) |
Tc(onset) (K) |
Critical Temperature (K) |
quenched |
0 |
97 |
91 |
quenched |
0.1 |
98 |
80 |
quenched |
0.2 |
99 |
67 |
quenched |
0.3 |
98 |
61 |
quenched |
0.4 |
92 |
49 |
quenched |
0.5 |
92 |
23 |
O2 anneal |
0 |
75 |
68 |
O2 anneal |
0.1 |
85 |
69 |
O2 anneal |
0.2 |
89 |
67 |
O2 anneal |
0.3 |
91 |
65 |
O2 anneal |
0.4 |
97 |
61 |
O2 anneal |
0.5 |
96 |
48 |
N2 anneal |
0 |
83 |
77 |
N2 anneal |
0.1 |
88 |
69 |
N2 anneal |
0.2 |
92 |
60 |
N2 anneal |
0.3 |
95 |
59 |
N2 anneal |
0.4 |
94 |
40 |
N2 anneal |
0.5 |
90 |
32 |
Measurement Method: Four-probe method
"The DC-resistivity of the rectangular slab samples was obtained in the temperature range 4.2-300 K by the conventional four-probe technique. The temperature of the samples was monitored using a standard PRT of 100 Ω in conjunction with a Keithley 195A DMM with an accuracy of ±0.1 K in the temperature range of 70-300 K. A liquid He cryostat with a Ge temperature sensor was used for the temperature range of 4.2-70 K. The entire measurement system comprising the nanovoltmeter, constant current source and temperature controller and indicator, was hooked onto a HP216 system controller for automatic data acquisition and control."
Cautions: Evaluated Data
Material Specification for Bi:2212; [Bi-Sr-Ca(Tm)-Cu-O]
Process: Solid State Reaction
Notes: "The samples of Bi2Sr2Ca1-xMxCu2O8+y (M = Eu, Dy, Tm) for 0 ≤x ≤0.6 were prepared by solid state reaction of appropriate quantities of well mixed metal oxides and carbonates with 4N purity. The calcination was carried out at 820 °C, 830 °C and 840 °C each for 12 h followed by furnace cooling to room temperature with intermediate grinding. Reacted materials were pulverized and cold pressed into three sets of rectangular pellets suitable for resistivity measurements. The first set of pellets was partially melted at 930 °C to 960 °C with increasing x (dopant concentration), and then reacted at 960 °C in air quenched to room temperature... The second set was annealed in O2 flow at a temperature of 860 °C for 12 h and then furnace cooled to room temperature over a span of 6 h. The third set was the same as above except that it was further annealed in flowing N2 at 600 °C for 12 h and then furnace cooled to room temperature over a span of 5 h."
Formula: Bi2Sr2Ca1-xTmxCu2O8+y
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca(Tm)-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Critical Temperature for Bi:2212; [Bi-Sr-Ca(Tm)-Cu-O]
Processing Condition () |
x (formula units) |
Tc(onset) (K) |
Critical Temperature (K) |
quenched |
0 |
98 |
89 |
quenched |
0.1 |
96 |
78 |
quenched |
0.2 |
94 |
76 |
quenched |
0.3 |
99 |
68 |
quenched |
0.4 |
94 |
51 |
quenched |
0.5 |
96 |
32 |
O2 anneal |
0 |
76 |
66 |
O2 anneal |
0.1 |
80 |
67 |
O2 anneal |
0.2 |
88 |
66 |
O2 anneal |
0.3 |
92 |
68 |
O2 anneal |
0.4 |
95 |
58 |
O2 anneal |
0.5 |
97 |
53 |
N2 anneal |
0 |
82 |
75 |
N2 anneal |
0.1 |
87 |
65 |
N2 anneal |
0.2 |
95 |
62 |
N2 anneal |
0.3 |
98 |
57 |
N2 anneal |
0.4 |
92 |
38 |
N2 anneal |
0.5 |
91 |
26 |
Measurement Method: Four-probe method
"The DC-resistivity of the rectangular slab samples was obtained in the temperature range 4.2-300 K by the conventional four-probe technique. The temperature of the samples was monitored using a standard PRT of 100 Ω in conjunction with a Keithley 195A DMM with an accuracy of ±0.1 K in the temperature range of 70-300 K. A liquid He cryostat with a Ge temperature sensor was used for the temperature range of 4.2-70 K. The entire measurement system comprising the nanovoltmeter, constant current source and temperature controller and indicator, was hooked onto a HP216 system controller for automatic data acquisition and control."
Cautions: Evaluated Data