NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Magnetic Penetration Depth of (La1-xSrx)2CuO4 Single Crystals
Author(s): Q. Li, M. Suenaga, T. Kimura, and K. Kishio
Publication: Physical Review B Volume: 47 Issue: 5 Year: 1993 Page(s): 2854-2860
Editor(s): Not Available
Publisher: American Physical Society
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Temperature, Penetration Depth

Materials and Properties

La:21; [La(Sr)-Cu-O]
Material Specification for La:21; [La(Sr)-Cu-O] Process: Floating Zone
Notes: The authors cite T. Kimura et al., Physica C, Vol. 192, 247 (1992), and summarize their procedure as follows. "... single-crystal samples used in this study were cut separately from a series of large single crystals, up to 5 mm along the c axis and over a wide range of Sr content. These were grown using a traveling solvent floating-zone technique... The Sr content of each crystal was analyzed by the inductively coupled plasma (ICP) technique. For the convenience of presentation, the four crystals that we studied are individually named as crystals A (51.2 mg, 3.20 mm along the c axis), B (29.0 mg, 2.00 mm along the c axis), C (13.85 mg, 1.4 mm along the c axis), and D (32.47 mg, 3.45 mm along the c axis)."
Formula: La2-xSrxCuO4
Informal Name: La:21
Chemical Family: La(Sr)-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Temperature for La:21; [La(Sr)-Cu-O]
Sample Number () x of Srx (formula units) Critical Temperature (K)
A 0.092 26.2
B 0.118 32.4
C 0.154 35.1
D 0.180 29.8
Measurement Method: SQUID magnetometer
The authors cite Q. Li et al., Phys Rev. B, Vol. 46, 3195 (1992), and summarize the procedure as follows. "All the magnetization measurements were carried out in magnetic fields applied parallel to the c axis using a Quantum Design superconducting quantum interference device (SQUID) magnetometer with a 3-cm scan length, where the field inhomogeneity is estimated to be no greater than 0.5%." The authors indicated that the penetration depth for the ab-plane was calculated using the model of Z. Hao et al., Phys. Rev. B, Vol. 43, 2844 (1991).

Cautions: Evaluated Data
Penetration Depth for La:21; [La(Sr)-Cu-O]
Sample Number () Temperature K () Penetration Depth (σ)
C 26 4000
C 28 4500
C 30 5300
C 32 6800
C 33 8000
Measurement Method: SQUID magnetometer
The authors cite Q. Li et al., Phys Rev. B, Vol. 46, 3195 (1992), and summarize the procedure as follows. "All the magnetization measurements were carried out in magnetic fields applied parallel to the c axis using a Quantum Design superconducting quantum interference device (SQUID) magnetometer with a 3-cm scan length, where the field inhomogeneity is estimated to be no greater than 0.5%." The authors indicated that the penetration depth for the ab-plane was calculated using the model of Z. Hao et al., Phys. Rev. B, Vol. 43, 2844 (1991).

Cautions: Evaluated Data
Digitized data were obtained from Figure 4 of the paper.