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Material Specification for Tl:2223; [Tl-Ba-Ca-Cu-O] Process: Solid State Reaction
Notes: The authors cite W.Y. Lee, Appl. Phys. Lett, Vol. 60, 772 (1992), and summarize the procedure as follows. "These films were prepared using the low-temperature/pressure annealing technique... Amorphous precursor films of 0.2-1.55 µm thickness were sputter deposited on 1 x 1 cm² (100) LaAlO₃ at ambient temperature (about 32 °C) from a pair of superconducting oxide targets, using a rf diode facing-target sputtering technique. The sputtering targets used were sintered pellets pressed from thoroughly mixed oxide powder mixtures with an initial cation ratio of 2:2:2:3. These films have a composition close to that of the targets used and are amorphous and nonconducting as deposited. They were made superconducting by post annealing under (3-15.2 kPa = 0.03-0.15 atm) O₂ at 800-860 °C for up to 15 h. The films were wrapped with 2223 pellets in gold foil and sealed in a quartz tube to minimize Tl loss during annealing... To minimize the nucleation and growth of the Tl₂CaBa₂Cu₂O₈ (2122) phase during annealing, a heating rate of > 5 °C/min was used."
Formula: Tl₂Ba₂Ca₂Cu₃O_x
Informal Name: Tl:2223
Chemical Family: Tl-Ba-Ca-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form: Thin Film

Surface Resistance for Tl:2223; [Tl-Ba-Ca-Cu-O]

Film Thickness (µm)	Temperature (K)	Surface Resistance (mΩ)
0.2	8	0.13
0.2	25	1.7
0.2	51	6.1
0.2	96	18
0.2	110	44
0.2	120	490
0.2	125	710
0.2	145	715
0.6	10	0.06
0.6	28	0.55
0.6	34	2.4
0.6	54	6.0
0.6	91	8.4
0.6	100	15
0.6	111	25
0.6	120	340
0.6	145	400

Measurement Method: Confocal resonator method
The authors cite J.S. Martens et al., J. Appl. Phys., Vol. 69, 8268 (1991), and summarize the procedure as follows. "All surface resistance... measurements were done using the confocal resonator technique. This technique is based on an open resonant structure formed between a spherical mirror and the planar sample under test. From the quality of the resonance, the resonant frequency, and the known characteristics of the mirror, the surface resistance of the sample can be determined with a sensitivity of about 0.07 mΩ in the 30-40 GHz range and about 0.8 mΩ in the 90-100 GHz range." The reported surface resistance values were obtained at 38 GHz.

Cautions: Evaluated Data
Digitized data were obtained from Figure 2 of the paper.

Penetration Depth for Tl:2223; [Tl-Ba-Ca-Cu-O]

Film Thickness (µm)	Penetration Depth (σ)
0.2	2215
0.4	1650
0.8	1450
1.4	1690
1.55	2560

Measurement Method: Penetration depth method
The authors cite J.S. Martens et al., IEEE Trans. Mag. MAG-25 (1989) 984, and summarize the procedure as follows. "The penetration depth of all films was measured at 77 K and from about 4-30 GHz using a microstrip flip-chip resonator technique."

Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.

Bibliographic Information

Materials and Properties

Tl:2223; [Tl-Ba-Ca-Cu-O]