NIST High Temp. Superconducting Materials (HTS) Database

NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Surface Resistance of Grain-Aligned YBa₂Cu₃O_x Bulk: Evidence of Two Kinds of Weak Link
Author(s): J. Wosik, L.M. Xie, R. Chau, A. Samaan, J.C. Wolfe, V. Selvamanickam, and D. Salama
Publication: Physical Review B Volume: 47 Issue: 14 Year: 1993 Page(s): 8968-8977
Editor(s): Not Available
Publisher: American Physical Society
Language: English
Notes: Not Available
Keywords: Material Specification, Surface Resistance

Materials and Properties

Material Specification for Y:123; [Y-Ba-Cu-O] Process: Liquid Phase Processing
Notes: The authors cite K. Salama et al., Appl. Phys. Lett., Vol. 54, 2352 (1989), and summarize the procedure as follows. "Grain-aligned samples... were fabricated for these measurements by a liquid phase process. In this method, a bar with stoichiometric starting composition is rapidly heated above the peritectic temperature to form 1:2:3 liquid and the solid Y₂BaCuO_x (211) phase. Then it is slowly cooled at the rate of 1-2 °C/h below the peritectic temperature. After cooling to room temperature the material is annealed at temperatures between 400 °C and 500 °C for several hours... The samples for rf measurement were cut parallel and perpendicular to the ab plane."
Formula: YBa₂Cu₃O_7-x
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Surface Resistance for Y:123; [Y-Ba-Cu-O]

Magnetic Field (T)	Temperature (K)	Surface Resistance (mΩ)
0.7	7	43
0.7	21	47
0.7	42	56
0.7	60	83
0.7	83	250
0.7	88	410
0.7	92	1000
0.7	96	3700
0.7	113	4600
0.7	124	5200
0.2	8	38
0.2	21	41
0.2	42	44
0.2	62	53
0.2	79	100
0.2	84	160
0.2	90	430
0.2	112	3600
0.2	117	3500
0.2	123	3300
0.02	7	33
0.02	21	34
0.02	41	35
0.02	64	48
0.02	80	100
0.02	90	410
0.02	96	3200
0.02	112	3500
0.02	125	3400
0	7	24
0	20	30
0	36	31
0	52	32
0	62	38
0	80	99
0	87	260
0	96	3500
0	109	4400
0	125	4500

Measurement Method: Surface resistance method
The authors cite J. Wosik et al., J. Appl. Phys., Vol. 69, 874 (1991), and summarize the procedure as follows. "Surface resistance was determined by calculating the unloaded quality factor Q of a cylindrical copper cavity in which the sample replaces one of the end plates. In the measurements, a one-port, side-fed copper cavity resonating at 75 GHz in the TE₀₁₁ mode was employed. An HP 8510B network analyzer with a 75-100 GHz test set was used for the measurements... During the measurements of R, as a function of dc magnetic field, the whole cryostat was placed between the poles of an electromagnet. A four quandrant power supply was used to eliminate the residual magnetic field in the magnet. The field was measured using a Hall probe placed inside of the cryostat. The cavity with the sample was cooled to 6 K at zero field (ZFC) and then the magnetic field was applied... For higher sensitivity measurements of the change in rf loss as a function of magnetic field, a Bruker ESP 300 electron-spin-resonance spectrometer with four quadrant magnetic power supply and an Oxford Instruments continuous gas flow cryostat was used. The sample was placed in the center of the 0.45 GHz TE₁₀₂ cavity using a quartz holder. The rf magnetic field was parallel to the ab plane of the sample for these measurements. The external dc magnetic field was perpendicular to the rf magnetic field and was modulated at 100 kHz with modulation amplitude smaller than 10^-7 T."

Cautions: Evaluated Data
Digitized data were obtained from Figure 3 of the paper.