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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Effect of Carrier Concentration on the Normal Transport Properties and the Superconducting Transition Temperature in the Tl2Ba2Ca1-xYxCu2O8+y System
Author(s): A. Poddar, P. Mandal, A.N. Das, B. Ghosh, and P. Choudhury
Publication: Physical Review B Volume: 44 Issue: 6 Year: 1991 Page(s): 2757-2761
Editor(s): Not Available
Publisher: American Physical Society
Language: English
Notes: Not Available
Keywords: Material Specification, Crystallography, Resistivity (normal state), Hall Coefficient

Materials and Properties

Tl:2212; [Tl-Ba-Ca(Y)-Cu-O]
Material Specification for Tl:2212; [Tl-Ba-Ca(Y)-Cu-O] Process: Solid State Reaction
Notes: "Yttrium substitued Tl2Ba2Ca1-xYxCu2O8+y samples... were prepared using the matrix method. The Ca1-xYxBa2CuO4+0.5x (x=0-0.60) compositions were prepared by calcining stoichiometric mixtures of CaCO3, BaCO3, Y2O3, and CuO at 920 °C for 24 h in air. The product was ground, pressed into pellets, and fired at 930 °C for 30 h in air. This process was repeated twice for each sample. Finally, Tl2O3, Ca1-xYxBa2CuO4+0.5x and CuO were mixed with molar ratio 1:1:1 (such that [Tl]:[Ba]:[Ca1-xYx]:[Cu]=2:2:1:2), pressed into pellets and annealed in oxygen at 830 °C for 6 h and then cooled to room temperature at the rate of 40 °C/h."
Formula: Tl2Ba2Ca1-xYxCu2O8+y
Informal Name: Tl:2212
Chemical Family: Tl-Ba-Ca(Y)-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for Tl:2212; [Tl-Ba-Ca(Y)-Cu-O]
Crystal System: Tetragonal
Formula Units per Cell:
Space Group:
Cell Parameters
x of Yx (formula units) Temp K a Å b Å c Å
0.0 296 3.865 -- 29.27
0.1 296 3.859 -- 29.25
0.2 296 3.865 -- 29.18
0.25 296 3.865 -- 29.08
0.3 296 3.867 -- 29.12
0.35 296 3.867 -- 28.98
0.48 296 3.868 -- 28.94
0.6 296 3.876 -- 28.93
Measurement Method: X-ray diffraction

Cautions: Unevaluated Data
No measurement details were noted. Digitized data were obtained from Figure 1 of the paper.
Resistivity (normal state) for Tl:2212; [Tl-Ba-Ca(Y)-Cu-O]
x of Yx (formula units) Temperature (K) Resistivity (normal state) (mΩ·cm)
0.35 29 0.0
0.35 42 4.9
0.35 52 20.0
0.35 80 40.3
0.35 114 50.1
0.35 197 58.6
0.35 295 69.0
0.30 51 0.0
0.30 72 13.2
0.30 106 26.8
0.30 171 35.0
0.30 236 41.9
0.30 304 47.2
0.25 56 0.0
0.25 77 14.4
0.25 115 23.8
0.25 188 31.1
0.25 267 36.5
0.25 300 39.0
0.20 69 0.0
0.20 89 6.5
0.20 119 10.6
0.20 180 13.2
0.20 226 15.4
0.20 303 17.8
0.0 85 0.0
0.0 95 1.2
0.0 107 5.7
0.0 152 9.2
0.0 218 12.0
0.0 297 14.8
Measurement Method: Four-probe method
"The temperature dependent dc resistance... (was) measured by the standard four-probe technique using silver paint contacts. Current from a constant current source was passed through the sample and the voltage was measured with a Keithley 181-nanovoltmeter. Current (of about) 1 mA was generally used..."

Cautions: Evaluated Data
The resistance values of Figure 2 in the paper were converted to resistivity values based on Figure 3 of the paper.
Hall Coefficient for Tl:2212; [Tl-Ba-Ca(Y)-Cu-O]
x of Yx (formula units) Temperature (K) Hall Coefficient (mm3 /C)
0.0 112 9.9
0.0 134 10.4
0.0 150 9.7
0.0 170 9.5
0.0 181 8.5
0.0 195 7.8
0.0 211 7.6
0.0 234 6.9
0.0 260 6.2
0.0 297 5.7
0.10 133 6.9
0.10 147 6.9
0.10 166 6.2
0.10 195 5.4
0.10 219 5.2
0.10 300 4.4
0.25 121 10.6
0.25 140 9.8
0.25 164 9.2
0.25 184 9.0
0.25 207 8.7
0.25 239 7.8
0.25 292 7.6
0.30 119 13.1
0.30 143 11.7
0.30 164 11.5
0.30 188 10.6
0.30 216 9.9
0.30 244 10.3
0.30 297 9.7
0.40 114 19.5
0.40 156 19.8
0.40 187 19.7
0.40 217 18.5
0.40 296 14.4
0.48 122 22.0
0.48 160 22.9
0.48 207 22.2
0.48 253 19.5
0.48 296 18.7
Measurement Method: Hall effect method
"For Hall voltage measurements low resistance contacts to the sample [10 x (2-3) x (0.2-0.3) (mm3)] were made by applying conductive silver paint in the desired configuration and annealing the same in the presence of oxygen at 550-570 °C for about 1 h. A current (of about) 30 mA was generally passed through the sample. The temperature of the sample was kept fixed for 15 min before recording any data. The magnetic field (about 1.59 MA/m = 20 kOe) was applied perpendicular to the plane of the sample and at right angles to the direction of the current. Hall measurements were performed in the temperature range where the magnetoresistance is negligible."

Cautions: Evaluated Data
Digitized data were obtained from Figure 5 of the paper.