NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Superconductivity in Tl-Bi-Ca-Sr-Cu-O and Tl-Bi-Pb-Ca-Sr-Cu-O Systems
Author(s): Y. Torii, H. Takei, and K. Tada
Publication: Japanese Journal of Applied Physics Volume: 28 Issue: Not Available Year: 1989 Page(s): L2192-L2195
Editor(s): Not Available
Publisher: Physical Soc. of Japan and the Jpn. Soc. of Applied Physics
Language: English
Notes: Not Available
Keywords: Material Specification, Crystallography, Critical Temperature, Magnetic Susceptibility

Materials and Properties

Tl:2223; [Tl(Bi)-Sr-Ca-Cu-O]
Material Specification for Tl:2223; [Tl(Bi)-Sr-Ca-Cu-O] Process: Solid State Reaction
Notes: "Samples... were prepared by the following method. First, appropriate amounts of CaCO3, SrCO3 and CuO powders were mixed well. These mixtures were calcined at 850 °C in air for 8 h; then powders of Tl2O3, Bi2O3, PbO and Ca-Sr-Cu-O compounds were mixed well to form mixtures with a nominal composition of Tl:Bi:Pb:Ca:Sr:Cu of 2(1-x):2x:y:2:2:3 and 1:1:y:4:2:5, where 0 ≤x ≤1 and y=0, 0.2, 0.4, or 0.6. These mixtures were pressed into pellets and wrapped in Au foil. Next, they were sintered at 880 to 920 °C in oxygen flow for 3 h to 6 h, then cooled down to room temperature."
Formula: Tl2-xBixSr2Ca2Cu3Oy
Informal Name: Tl:2223
Chemical Family: Tl(Bi)-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for Tl:2223; [Tl(Bi)-Sr-Ca-Cu-O]
Crystal System: Tetragonal
Formula Units per Cell:
Space Group:
Cell Parameters
x of Bix (formula units) Temp K a Å b Å c Å
0.4 296 3.813(3) -- 15.266(5)
Measurement Method: X-ray diffraction
"The crystal structure was analyzed through the X-ray diffraction method, and the lattice constants were calculated using the least squares method." No additional measurement details were noted.

Cautions: Evaluated Data
Critical Temperature for Tl:2223; [Tl(Bi)-Sr-Ca-Cu-O]
Sintering Temperature (°C) Sintering Time (h) x of Bix (formula units) Critical Temperature (K)
870 12 0.0 65
870 12 0.4 75
870 12 0.6 74
870 12 0.8 75
870 12 0.1 73
870 12 1.2 71
870 12 1.4 74
870 12 1.6 73
870 12 1.8 67
870 12 2.0 64
900 6 0.0 50
900 6 0.3 109
900 6 0.4 114
900 6 0.6 109
900 6 0.8 109
900 6 1.2 101
900 6 1.4 82
900 6 1.6 79
900 6 2.0 79
Measurement Method: Four-probe method
"The electrical resistivity of the samples was measured by the standard four-probe method... The critical temperature... is defined as the temperature at which zero resistivity occurs." No additional measurement details were noted.

Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.
Magnetic Susceptibility for Tl:2223; [Tl(Bi)-Sr-Ca-Cu-O]
x of Bix (formula units) Temperature (K) Magnetic Susceptibility (arbitrary)
1.6 11 -0.24
1.6 35 -0.24
1.6 55 -0.22
1.6 69 -0.14
1.6 80 0.00
1.6 103 0.00
1.6 144 0.00
1.2 20 -0.42
1.2 37 -0.42
1.2 53 -0.41
1.2 68 -0.34
1.2 73 -0.21
1.2 77 -0.18
1.2 94 -0.14
1.2 107 -0.08
1.2 114 0.0
1.2 144 0.0
0.8 13 -0.47
0.8 33 -0.47
0.8 41 -0.47
0.8 54 -0.45
0.8 56 -0.46
0.8 73 -0.35
0.8 85 -0.26
0.8 96 -0.21
0.8 110 -0.10
0.8 112 0.00
0.8 144 0.00
0.4 7 -0.52
0.4 38 -0.50
0.4 67 -0.48
0.4 87 -0.41
0.4 104 -0.26
0.4 110 -0.11
0.4 112 0.00
0.4 129 0.00
0.4 144 0.00
Measurement Method: SQUID magnetometer
"... the DC magnetic susceptibility (was measured) by a SQUID magnetometer." No additional measurement details were noted.

Cautions: Evaluated Data
Digitized data were obtained from Figure 3 of the paper.