Material Specification for Tl:1223; [Tl-Ba-Ca-Cu-O:Ag]
Process: Solid State Reaction
Notes: "In this paper we report details of our "silver-addition" process for the fabrication of "1223" thick films... Precursor oxide films weighing (about) 0.001 g were prepared on 12.5 mm x 8 mm x 0.5 polycrystalline yttria-stabilized zirconia substrates using a 0.18M (total metal ions) aqueous spray solution of barium, calcium, copper, and silver nitrates having a Ca:Ba:Cu:Ag mole ratio of 2:2:3:0.37. The spray solution was prepared from calcium carbonate (Johnson Matthey-puratronic grade), barium carbonate (Johnson Matthey-puratronic grade), silver nitrate (Johnson Matthey- puratronic grade), 5N copper shot (Johnson Matthey), semiconductor grade nitric acid, and deionized water... The substrate heater block was maintained at 275 °C during the deposition after which it was heated to and held at 650 °C for 5 min and then cooled to 275 °C. The samples were transferred to a movable tray positioned inside an annealing furnace combustion tube through which was maintained a flow of ultra high purity oxygen. The tray was moved into the furnace hot zone which had been preheated to 500 °C. The sample temperature was programmed to rise from 500 °C to 845 °C in 30 min at which point the furnace was turned off and the sample allowed to cool under oxygen to 300 °C ( (about) 2h). The sample tray was then moved within the combustion tube to a position outside the furnace where it was allowed to cool under oxygen before removal. The precursor oxide films were converted to superconducting films in an oxygen ambient via reaction with thallium oxide vapor in the two-zone reactor... After the two-zone reactor process the films were patterned with a test bridge structure... and then heated in an oxygen ambient. The sample temperature was programmed to rise from room temperature to 600 °C at 100 °C/h. hold at 600 °C for 8 h, and then drop to 100 °C/h."
Formula: TlBa2Ca2Cu3Ox•yAg
Informal Name: Tl:1223
Chemical Family: Tl-Ba-Ca-Cu-O:Ag
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form: Thin Film
Critical Temperature for Tl:1223; [Tl-Ba-Ca-Cu-O:Ag]
Critical Temperature (K) |
106 ± 1 |
Measurement Method: Four-probe method
"The films were patterned with a test bridge structure using the photoresist process... For this study we used both a "small" 0.4 mm x 0.1 mm bridge and a larger 4 mm x 0.2 mm bridge. The larger bridge was patterned to permit measuremnt across the full 4 mm bridge length and each of four 1 mm segments. The resistance versus temperature characteristic was determined by a four point prove DC measurement. From this plot we determined the temperature, T
c(0), at which the resistance became zero. Measurement of the zero-field DC transport critical current density, J
c(ZF 77 K), was made with the same apparatus using a 1 µV/cm criterion... transport measurements were made in a variable temperature cryostat containing a 9 T superconducting magnet. Contact to the sample was made using silver-paint applied over annealed silver pads. Measurement of the critical current versus magnetic field at each temperature was made having first cooled in zero-field from above T
c. An electric field criterion of 1 µV/cm was used to define J
c. Measurements were made both with the field applied parallel and perpendicular to the substrate."
Cautions: Evaluated Data
Critical Current Density for Tl:1223; [Tl-Ba-Ca-Cu-O:Ag]
Field Direction () |
Temperature (K) |
Magnetic Field (T) |
Critical Current Density (kA/cm2) |
//c-axis |
4.2 |
0.02 |
520 |
//c-axis |
4.2 |
0.05 |
320 |
//c-axis |
4.2 |
0.1 |
240 |
//c-axis |
4.2 |
0.2 |
200 |
//c-axis |
4.2 |
0.5 |
150 |
//c-axis |
4.2 |
1 |
120 |
//c-axis |
4.2 |
2 |
110 |
//c-axis |
4.2 |
5 |
100 |
//c-axis |
4.2 |
10 |
100 |
//c-axis |
20 |
0.02 |
390 |
//c-axis |
20 |
0.05 |
250 |
//c-axis |
20 |
0.1 |
180 |
//c-axis |
20 |
0.2 |
140 |
//c-axis |
20 |
0.5 |
100 |
//c-axis |
20 |
1 |
100 |
//c-axis |
20 |
2 |
93 |
//c-axis |
20 |
5 |
84 |
//c-axis |
20 |
10 |
76 |
//c-axis |
40 |
0.02 |
300 |
//c-axis |
40 |
0.05 |
160 |
//c-axis |
40 |
0.1 |
110 |
//c-axis |
40 |
0.2 |
80 |
//c-axis |
40 |
0.5 |
72 |
//c-axis |
40 |
1 |
65 |
//c-axis |
40 |
2 |
59 |
//c-axis |
40 |
5 |
40 |
//c-axis |
40 |
10 |
23 |
//c-axis |
60 |
0.02 |
190 |
//c-axis |
60 |
0.05 |
81 |
//c-axis |
60 |
0.1 |
56 |
//c-axis |
60 |
0.2 |
42 |
//c-axis |
60 |
0.5 |
31 |
//c-axis |
60 |
1 |
26 |
//c-axis |
60 |
2 |
16 |
//c-axis |
60 |
3 |
6.4 |
//c-axis |
60 |
4 |
2.1 |
//c-axis |
60 |
5 |
0.25 |
//c-axis |
77 |
0.02 |
69 |
//c-axis |
77 |
0.05 |
27 |
//c-axis |
77 |
0.2 |
14 |
//c-axis |
77 |
0.5 |
9.5 |
//c-axis |
77 |
0.8 |
6.5 |
//c-axis |
77 |
1 |
1.4 |
//c-axis |
77 |
2 |
0.11 |
//c-axis |
90 |
0.02 |
25 |
//c-axis |
90 |
0.05 |
8.9 |
//c-axis |
90 |
0.2 |
4.6 |
//c-axis |
90 |
0.5 |
0.66 |
//c-axis |
90 |
0.6 |
0.26 |
//ab-plane |
4.2 |
0.5 |
290 |
//ab-plane |
4.2 |
1 |
240 |
//ab-plane |
4.2 |
2 |
220 |
//ab-plane |
4.2 |
9 |
180 |
//ab-plane |
20 |
0.1 |
350 |
//ab-plane |
20 |
0.2 |
290 |
//ab-plane |
20 |
1 |
180 |
//ab-plane |
20 |
5 |
120 |
//ab-plane |
20 |
10 |
120 |
//ab-plane |
40 |
0.02 |
330 |
//ab-plane |
40 |
0.05 |
300 |
//ab-plane |
40 |
0.2 |
200 |
//ab-plane |
40 |
1 |
110 |
//ab-plane |
40 |
5 |
71 |
//ab-plane |
40 |
10 |
71 |
//ab-plane |
60 |
0.02 |
200 |
//ab-plane |
60 |
0.05 |
170 |
//ab-plane |
60 |
0.1 |
130 |
//ab-plane |
60 |
0.5 |
66 |
//ab-plane |
60 |
1 |
45 |
//ab-plane |
60 |
2 |
37 |
//ab-plane |
60 |
5 |
25 |
//ab-plane |
60 |
10 |
19 |
//ab-plane |
77 |
0.02 |
120 |
//ab-plane |
77 |
0.1 |
55 |
//ab-plane |
77 |
0.5 |
21 |
//ab-plane |
77 |
2 |
11 |
//ab-plane |
77 |
5 |
3.0 |
//ab-plane |
77 |
9 |
0.20 |
//ab-plane |
90 |
0.02 |
46 |
//ab-plane |
90 |
0.1 |
16 |
//ab-plane |
90 |
0.5 |
5.8 |
//ab-plane |
90 |
1 |
3.7 |
//ab-plane |
90 |
2 |
0.99 |
Measurement Method: Four-probe method
"The films were patterned with a test bridge structure using the photoresist process... For this study we used both a "small" 0.4 mm x 0.1 mm bridge and a larger 4 mm x 0.2 mm bridge. The larger bridge was patterned to permit measuremnt across the full 4 mm bridge length and each of four 1 mm segments. The resistance versus temperature characteristic was determined by a four point prove DC measurement. From this plot we determined the temperature, T
c(0), at which the resistance became zero. Measurement of the zero-field DC transport critical current density, J
c(ZF 77 K), was made with the same apparatus using a 1 µV/cm criterion... transport measurements were made in a variable temperature cryostat containing a 9 T superconducting magnet. Contact to the sample was made using silver-paint applied over annealed silver pads. Measurement of the critical current versus magnetic field at each temperature was made having first cooled in zero-field from above T
c. An electric field criterion of 1 µV/cm was used to define J
c. Measurements were made both with the field applied parallel and perpendicular to the substrate."
Cautions: Evaluated Data
Digitized data were obtained from Figures 9 and 10 of the paper.