Material Specification for Y:123; [Y-Ba-Cu(Zn)-O]
Process: Flux Growth
Notes: The authors cite R. Liang et al., Physica C, Vol. 195, 51 (1992), and summarize the procedure as follows. "... we have grown crystals... with Zn concentrations... The crystals were grown by incorporating ZnO into the same flux growth technique as that used to produce high purity crystals. The Zn concentration is inferred from susceptibility measurements of Tc using the known relationship between Zn concentration and Tc for polycrystalline samples."
Formula: YBa2Cu3-xZnxO6.95
Informal Name: Y:123
Chemical Family: Y-Ba-Cu(Zn)-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Critical Temperature for Y:123; [Y-Ba-Cu(Zn)-O]
x of Znx (formula units) |
Critical Temperature (K) |
0 |
92.0 |
0.0045 |
91.6 |
0.0093 |
89.6 |
Measurement Method: Cavity resonator method
"Cavity perturbation techniques were used to measure the surface resistance at two different frequencies. The measurements at 3.8 GHz were obtained with a split-ring resonator technique and the 34.8 GHz data were obtained by inserting a crystal into the axial ac magnetic field of a cylindrical cavity operating in the Te
011 mode. Both resonators were coated with a superconducting Pb:Sn layer in order to achieve the high Q's necessary for measurements of low loss in small samples; both measurement configurations involve currents running in the ab plane of the sample."
Cautions: Evaluated Data
Surface Resistance for Y:123; [Y-Ba-Cu(Zn)-O]
Frequency (GHz) |
x of Znx (formula units) |
Temperature () |
Surface Resistance (mΩ) |
34.8 |
0 |
5 |
0.89 |
34.8 |
0 |
10 |
1.2 |
34.8 |
0 |
36 |
2.3 |
34.8 |
0 |
60 |
2.8 |
34.8 |
0 |
79 |
2.4 |
34.8 |
0 |
87 |
4.6 |
34.8 |
0 |
93 |
41 |
34.8 |
0 |
95 |
260 |
34.8 |
0 |
116 |
360 |
34.8 |
0.0045 |
5 |
0.51 |
34.8 |
0.0045 |
18 |
0.87 |
34.8 |
0.0045 |
39 |
1.6 |
34.8 |
0.0045 |
64 |
1.8 |
34.8 |
0.0045 |
82 |
2.4 |
34.8 |
0.0045 |
91 |
21 |
34.8 |
0.0045 |
92 |
110 |
34.8 |
0.0045 |
94 |
240 |
34.8 |
0.0045 |
116 |
360 |
34.8 |
0.0093 |
5 |
0.27 |
34.8 |
0.0093 |
30 |
0.77 |
34.8 |
0.0093 |
61 |
1.4 |
34.8 |
0.0093 |
82 |
2.7 |
34.8 |
0.0093 |
88 |
11 |
34.8 |
0.0093 |
90 |
190 |
34.8 |
0.0093 |
96 |
330 |
34.8 |
0.0093 |
116 |
360 |
3.8 |
0 |
2 |
0.014 |
3.8 |
0 |
9 |
0.014 |
3.8 |
0 |
17 |
0.022 |
3.8 |
0 |
25 |
0.030 |
3.8 |
0 |
46 |
0.041 |
3.8 |
0 |
54 |
0.036 |
3.8 |
0 |
68 |
0.029 |
3.8 |
0 |
85 |
0.035 |
3.8 |
0 |
92 |
0.41 |
3.8 |
0 |
94 |
45 |
3.8 |
0 |
96 |
110 |
3.8 |
0 |
120 |
130 |
3.8 |
0.0045 |
21 |
0.0098 |
3.8 |
0.0045 |
31 |
0.012 |
3.8 |
0.0045 |
34 |
0.0097 |
3.8 |
0.0045 |
37 |
0.015 |
3.8 |
0.0045 |
44 |
0.012 |
3.8 |
0.0045 |
58 |
0.017 |
3.8 |
0.0045 |
61 |
0.013 |
3.8 |
0.0045 |
69 |
0.020 |
3.8 |
0.0045 |
72 |
0.015 |
3.8 |
0.0045 |
75 |
0.020 |
3.8 |
0.0045 |
79 |
0.018 |
3.8 |
0.0045 |
88 |
0.062 |
3.8 |
0.0045 |
91 |
0.26 |
3.8 |
0.0045 |
110 |
120 |
3.8 |
0.0045 |
121 |
130 |
3.8 |
0.0093 |
5 |
0.23 |
3.8 |
0.0093 |
24 |
0.55 |
3.8 |
0.0093 |
39 |
0.94 |
3.8 |
0.0093 |
59 |
1.3 |
3.8 |
0.0093 |
79 |
2.2 |
3.8 |
0.0093 |
89 |
12 |
3.8 |
0.0093 |
92 |
240 |
3.8 |
0.0093 |
95 |
330 |
3.8 |
0.0093 |
116 |
410 |
Measurement Method: Cavity resonator method
"Cavity perturbation techniques were used to measure the surface resistance at two different frequencies. The measurements at 3.8 GHz were obtained with a split-ring resonator technique and the 34.8 GHz data were obtained by inserting a crystal into the axial ac magnetic field of a cylindrical cavity operating in the Te
011 mode. Both resonators were coated with a superconducting Pb:Sn layer in order to achieve the high Q's necessary for measurements of low loss in small samples; both measurement configurations involve currents running in the ab plane of the sample."
Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.