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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Synthesis and Characterization of a Tl-2223 Superconductor with Tc = 130 K
Author(s): H. Yamauchi and T. Kaneko
Publication: HTS Materials, Bulk Processing and Bulk Applications Volume: Not Available Issue: Not Available Year: 1992 Page(s): 64-69
Editor(s): C.W. Chu, W.K. Chu, P.H. Hor, and K. Salama
Publisher: World Scientific
Language: English
Notes: Proceedings of the 1992 TCSUH Workshop, February 27-28, 1992
Keywords: Material Specification, Crystallography, Critical Temperature, Resistivity (normal state), Magnetic Susceptibility, Thermoelectric Power

Materials and Properties

Tl:2223; [Tl-Ba-Ca-Cu-O]
Material Specification for Tl:2223; [Tl-Ba-Ca-Cu-O] Process: Solid State Reaction
Notes: "The samples... were prepared by a solid state reaction using high-purity powders of Tl2O3, BaO2, CaO and CuO as starting materials. The powders were mixed to obtain nominal compositions of... Tl1.7Ba2Ca2.3Cu3Oz... The 2223 samples were sintered at 890 °C for 5 h in flowing oxygen gas. ... Each sintered sample was encapsulated in an evacuated quartz tube and post-annealed at 750 °C for various periods of time (2 - 400 h)."
Formula: Tl2Ba2Ca2Cu3O10
Informal Name: Tl:2223
Chemical Family: Tl-Ba-Ca-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for Tl:2223; [Tl-Ba-Ca-Cu-O]
Crystal System: Tetragonal
Formula Units per Cell:
Space Group:
Cell Parameters
Annealing Time (h) Temp K a Å b Å c Å
0 296 3.8493 -- 35.627
80 296 3.8490 -- 35.665
150 296 3.8485 -- 35.681
250 296 3.8490 -- 35.715
Measurement Method: X-ray diffraction
"The structural properties were studied by X-ray powder diffraction (XRD) using CuKα radiation." No additional measurement details were noted.

Cautions: Evaluated Data
Digitized data were obtained from Figure 5 of the paper.
Critical Temperature for Tl:2223; [Tl-Ba-Ca-Cu-O]
Annealing Time (h) Tc(magnetic) (K) Critical Temperature (K)
0 122 118
250 130 127
Measurement Method: Four-probe method
"Electrical resistivity was measured using a standard four-probe method." No additional measurement details were noted.

Cautions: Evaluated Data
Resistivity (normal state) for Tl:2223; [Tl-Ba-Ca-Cu-O]
Annealing Time (h) Temperature (K) Resistivity (normal state) (mΩ·cm)
0 115 0
0 118 0
0 119 0.09
0 123 0.65
0 127 0.83
0 133 0.95
0 139 1.04
80 122 0
80 125 0
80 126 0.39
80 129 0.85
80 130 1.00
80 131 1.09
80 132 1.05
80 133 1.16
80 135 1.20
80 136 1.27
80 137 1.25
80 139 1.31
150 125 0
150 126 0
150 128 0.49
150 130 0.85
150 133 1.04
150 137 1.15
150 140 1.20
150 140 1.18
250 127 0
250 129 0.53
250 132 0.84
250 135 1.00
250 138 1.09
250 140 1.13
Measurement Method: Four-probe method
"Electrical resistivity was measured using a standard four-probe method." No additional measurement details were noted.

Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.
Magnetic Susceptibility for Tl:2223; [Tl-Ba-Ca-Cu-O]
Annealing Time (h) Temperature (K) Magnetic Susceptibility (arbitrary)
0 115.0 -0.0021
0 117.0 -0.0022
0 118.0 -0.0023
0 119.9 -0.0002
0 121.0 0
0 135.0 0
80 114.9 -0.0032
80 118.0 -0.0032
80 120.6 -0.0032
80 123.6 -0.0030
80 124.9 -0.0015
80 125.5 -0.0002
80 126.0 0
80 135.0 0
150 114.9 -0.0032
150 119.0 -0.0033
150 122.0 -0.0033
150 125.5 -0.0030
150 127.0 -0.0016
150 128.0 0
150 135.0 0
250 115.0 -0.0028
250 119.0 -0.0028
250 124.0 -0.0028
250 127.4 -0.0023
250 128.5 -0.0005
250 129.0 0
250 135.0 0
Measurement Method: SQUID magnetometer
"The DC magnetic susceptibility measurements were carried out using a SQUID magnetometer (Quantum Design: Model MPMS) in the field-cooling mode with a DC magnetic field of (796 A/m = 10 Oe)."

Cautions: Evaluated Data
Digitized data were obtained from Figure 2 of the paper.
Thermoelectric Power for Tl:2223; [Tl-Ba-Ca-Cu-O]
Annealing Time (h) Temperature (K) Thermoelectric Power (µV/K)
0 100 0
0 109 0
0 120 0
0 129 6.7
0 149 6.5
0 190 5.4
0 240 3.8
0 291 2.3
250 100 -0.3
250 115 -0.2
250 120 -0.5
250 124 0
250 129 4.0
250 140 5.1
250 161 4.2
250 170 4.5
250 180 4.0
250 200 3.7
250 240 2.3
250 251 2.4
250 261 2.0
250 291 1.3
Measurement Method: Thermopower method
"The thermoelectric power (TEP) was measured by a DC differential method in which the temperature gradient across the sample was determined using two pairs of copper-constantan thermocouple." No additional measurement details were noted.

Cautions: Evaluated Data
Digitized data were obtained from Figure 4 of the paper.