Material Specification for Bi:4413; [Bi-Sr-Ca-Cu-O]
Process: Melt Processed
Notes: The authors cite A.M. Balbashov et al., J. Cryst. Growth, Vol. 52, 498 (1981), and summarize the procedure as follows. The crystals... were prepared by the non-crucible zone-melting method... The crystals were of a plate-like form with maximum dimensions of up to 1.5 x 0.5 x 0.1 mm3... a fairly good crystal with dimensions 0.5 x 0.16 x 0.028 mm3 was selected for the diffraction experiment."
Formula: Bi4Sr4CaCu3O14+x
Informal Name: Bi:4413
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for Bi:4413; [Bi-Sr-Ca-Cu-O]
| Crystal System: | Orthorhombic |
| Formula Units per Cell: | 2 |
| Space Group: |
Pbmm
|
Cell Parameters
| Occupancy () |
Temp
K
|
a
Å
|
b
Å
|
c
Å
|
| -- |
296 |
5.411(2) |
5.417(3) |
27.75(1) |
Atomic Coordinates
| Occupancy () |
Atom |
Temp
K
|
a-axis |
b-axis |
c-axis |
| 0.5 |
Bi(1) |
296 |
0.247(2) |
0.703(2) |
0.2796(2) |
| 0.5 |
Bi(2) |
296 |
0.222(1) |
0.19691) |
0.1626(2) |
| 1 |
Sr(1) |
296 |
0.236(4) |
0.25 |
0.3745(4) |
| 1 |
Sr(2) |
296 |
0.231(3) |
0.75 |
0.0612(3) |
| 1 |
Cu(1) |
296 |
0.259(8) |
0.25 |
0 |
| 1 |
Cu(2) |
296 |
0.255(5) |
0.75 |
0.4375(5) |
| 1 |
O(1) |
296 |
0.5 |
0 |
0 |
| 1 |
O(2) |
296 |
0 |
0 |
0 |
| 1 |
O(3) |
296 |
0.240(22) |
0.25 |
0.087(2) |
| 1 |
O(4) |
296 |
0 |
0 |
0.438(4) |
| 1 |
O(5) |
296 |
0.5 |
0 |
0.445(3) |
| 1 |
O(6) |
296 |
0.806(13) |
0.25 |
0.347(2) |
| 0.5 |
O(7) |
296 |
0.599(26) |
0.000(40) |
0.243(3) |
| 0.5 |
O(8) |
296 |
0.949(34) |
0.055(32) |
0.200(4) |
| 1 |
Ca |
296 |
0.268(9) |
0.25 |
0.5 |
Measurement Method: X-ray diffraction
"The intregrated intensities of the main reflections were measured using a three-cricle automated diffractometer with graphite-monochromatized AgKα radiation (wavelength = 0.56083 σ). A perpendicular-inclination technique was used. The a-axis of the crystal was oriented along the w-axis of the diffractometer. The w-step-scan mode was used with a scanning speed of 1.2° min
-1 and a counter aperture of 2θ=1.5°. Only the unique reflections of one octant of reciprocal space were measured. The background was substracted... In total, we obtained 167 fundamental reflections. The structure was determined by direct methods using the crystallographic program AREN-90 and the modified least-squares program ORFLS."
Cautions: Evaluated Data
Critical Temperature for Bi:4413; [Bi-Sr-Ca-Cu-O]
| ΔTc (K) |
Critical Temperature (K) |
| 8 |
84 |
Measurement Method: Electrical resistance
The authors cite A.A. Bush et al., Superconductivity: phys. chem. ingen, Vol. 4, 788 (1991). T
c(0) was reported as the critical temperature. No additional measurement details were noted.
Cautions: Unevaluated Data
