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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Nonlinear Surface Impedance for YBa2Cu3O7-x Thin Films: Measurements and a Coupled-Grain Model
Author(s): P.P. Nguyen, D.E. Oates, G. Dresselhaus, and M.S. Dresselhaus
Publication: Physical Review B Volume: 48 Issue: 9 Year: 1993 Page(s): 6400-6412
Editor(s): Not Available
Publisher: American Physical Society
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Temperature, Surface Resistance, Penetration Depth

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process: Sputtering
Notes: The authors cite A.S. Westerheim et al., IEEE Trans. Magn., Vol. 27, 1001 (1991), and summarize the procedure as follows. "The films were deposited by off-axis in situ sputtering onto LaAlO3 substrates."
Formula: YBa2Cu3O7-x
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form: Thin Film

Critical Temperature for Y:123; [Y-Ba-Cu-O]
Critical Temperature (K)
86.4
Measurement Method: Resonator method
The authors cite D.E. Oates et al., IEEE Trans. Microwave Theory Tech., Vol. 39, 1522 (1991), and summarize the procedure as follows. "A stripline resonator technique was used to measure the surface impedance... The superconducting transition temperatures Tc were determined from rf measurements... The zero-temperature penetration depth... was estimated from the temperature dependence of the resonant frequencies... the peak surface magnetic field generated by the rf current... is varied by changing the input power to the resonator and measuring Q and the resonant frequency f0 as a function of power level. Rc and Xc are derived from Q and f0, respectively."

Cautions: Evaluated Data
Surface Resistance for Y:123; [Y-Ba-Cu-O]
Frequency (GHz) Temperature (K) Magnetic Field (mA/m) Surface Resistance (mΩ)
1.5 84.3 0 0.04
1.5 84.3 1 0.12
1.5 84.3 1 0.19
1.5 84.3 1 0.30
1.5 82.3 0 0.02
1.5 82.3 1 0.05
1.5 82.3 2 0.10
1.5 82.3 3 0.24
1.5 77.4 0 0.02
1.5 77.4 4 0.04
1.5 77.4 6 0.12
1.5 77.4 7 0.20
1.5 77.4 8 0.29
1.5 65.6 1 0.01
1.5 65.6 5 0.02
1.5 65.6 10 0.06
1.5 65.6 15 0.14
1.5 46.9 1 0.01
1.5 46.9 8 0.01
1.5 46.9 18 0.04
1.5 46.9 26 0.09
1.5 46.9 31 0.14
1.5 4.3 6 0.00
1.5 4.3 17 0.02
1.5 4.3 28 0.04
1.5 4.3 33 0.07
1.5 4.3 40 0.11
7.7 79.0 0.2 0.34
7.7 79.0 1.7 0.43
7.7 79.0 2.5 0.60
7.7 79.0 3.1 0.78
4.6 79.0 0.1 0.20
4.6 79.0 1.6 0.22
4.6 79.0 3.5 0.33
4.6 79.0 5.2 0.54
4.6 79.0 5.0 0.59
4.6 79.0 5.5 0.63
3.1 79.0 0.1 0.06
3.1 79.0 2.9 0.09
3.1 79.0 4.9 0.17
3.1 79.0 6.1 0.28
3.1 79.0 6.9 0.40
1.5 79.0 0.2 0.01
1.5 79.0 4.0 0.04
1.5 79.0 6.8 0.12
1.5 79.0 9.5 0.27
1.5 79.0 11.5 0.37
Measurement Method: Resonator method
The authors cite D.E. Oates et al., IEEE Trans. Microwave Theory Tech., Vol. 39, 1522 (1991), and summarize the procedure as follows. "A stripline resonator technique was used to measure the surface impedance... The superconducting transition temperatures Tc were determined from rf measurements... The zero-temperature penetration depth... was estimated from the temperature dependence of the resonant frequencies... the peak surface magnetic field generated by the rf current... is varied by changing the input power to the resonator and measuring Q and the resonant frequency f0 as a function of power level. Rc and Xc are derived from Q and f0, respectively."

Cautions: Evaluated Data
Digitized data were obtained from Figures 5 and 8 of the paper.
Penetration Depth for Y:123; [Y-Ba-Cu-O]
Frequency (GHz) Temperature (K) Magnetic Field (kA/m) Penetration Depth (σ)
1.5 84.3 0.5 1705
1.5 84.3 1.3 1743
1.5 84.3 1.4 1777
1.5 84.3 1.7 1836
1.5 82.3 0.9 1705
1.5 82.3 2.1 1736
1.5 82.3 2.5 1757
1.5 82.3 2.8 1791
1.5 77.4 0.6 1701
1.5 77.4 2.5 1708
1.5 77.4 4.9 1733
1.5 77.4 6.2 1760
1.5 77.4 7.4 1800
1.5 77.4 7.9 1818
1.5 65.6 2.2 1701
1.5 65.6 5.0 1709
1.5 65.6 8.5 1731
1.5 65.6 10.6 1749
1.5 65.6 12.4 1777
1.5 65.6 14.9 1814
1.5 46.9 1.0 1701
1.5 46.9 3.5 1701
1.5 46.9 5.1 1700
1.5 46.9 7.9 1705
1.5 46.9 10.5 1708
1.5 46.9 13.8 1716
1.5 46.9 17.2 1728
Measurement Method: Resonator method
The authors cite D.E. Oates et al., IEEE Trans. Microwave Theory Tech., Vol. 39, 1522 (1991), and summarize the procedure as follows. "A stripline resonator technique was used to measure the surface impedance... The superconducting transition temperatures Tc were determined from rf measurements... The zero-temperature penetration depth... was estimated from the temperature dependence of the resonant frequencies... the peak surface magnetic field generated by the rf current... is varied by changing the input power to the resonator and measuring Q and the resonant frequency f0 as a function of power level. Rc and Xc are derived from Q and f0, respectively."

Cautions: Evaluated Data
Digitized data were obtained from Figure 6 of the paper.