NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Concentration-Dependent Oxygen Diffusivity in YBa2Cu3O6+x
Author(s): J.R. LaGraff and D.A. Payne
Publication: Physica C Volume: 212 Issue: Not Available Year: 1993 Page(s): 470-477
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Temperature, Diffusion Coefficient

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process: Solid State Reaction
Notes: The authors cite J.R. LaGraff et al., Physica C, Vol. 169, 355 (1990), and summarize the procedure as follows. "Specimen size (was) 2x1.5x0.5 mm3 (and the) impurity content in atomic fractions per formula unit (was) Fe: 0.0036(2); Al: 0.0010(2); and Zr: 0.020(1)."
Formula: YBa2Cu3Ox
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Temperature for Y:123; [Y-Ba-Cu-O]
Critical Temperature (K)
90
Measurement Method: SQUID magnetometer
"Superconducting transition temperatures were determined from SQUID susceptibility measurements in a field of (1 mT = 10 G)..." No additional measurement details were noted.

Cautions: Unevaluated Data
Diffusion Coefficient for Y:123; [Y-Ba-Cu-O]
Diffusing Species () Temperature (°C) Initial x of Ox (formula units) Final x of Ox (formula units) Diffusion Coefficient (log10(cm2/s))
O2 650 6.53 6.70 -5.68
O2 650 6.37 6.70 -5.51
O2 650 6.21 6.70 -5.34
O2 708 6.44 6.60 -5.33
O2 708 6.27 6.60 -5.28
O2 708 6.14 6.60 -5.09
Measurement Method: Resistance method
"Four gold wire leads (0.0508 mm = 0.002 inch, Be-modified) were attached by silver paste to the corners of the rectangular crystals... The specimens were subsequently mounted inside the hot-stage of an optical microscope. The annealed electrodes had contact resistances of less than (about) 1 Ω... The electrical resistance was monitored by a computer-controlled Stanford SR530 lock-in amplifier with a measuring AC current of 1.86 mA at 564 scrubbed for water vapor and carbon dioxide by passing through a column containing CaO and CaSO4. The resistance was recorded every 30-60 s during out-diffusion and between 8 s and 15 s during in-diffusion."

Cautions: Evaluated Data
The data were obtained from the tabulated data in Table 2 of the companion paper, J.R. LaGraff and D.A. Payne, Physica C, Vol. 212, pp. 478-486 (1993).