Material Specification for ; [Y-Ni(Pd)-B-C]
Process: Melt Processed
Notes: "The samples examined were prepared by the standard arc-melt technique. The starting materials were Alfa Y chips (99.9%), Alfa Pd wires (99.9%), Pither Industries B grains (99.999%), Alfa C wafers (99.9%), and Alfa Ni wires (99.9%). Appropriate amounts of the starting materials were arc-melted in a water-cooled Cu hearth in an Ar atmosphere at least four times. The buttons were turned over between the melts to enhance homogeneity. To reduce the loss of B, the arc was brought close to the sample very slowly. The overall loss in weight of the sample due to arc-melting was < 1%."
Formula: YNi2-xPdxB2C
Informal Name:
Chemical Family: Y-Ni(Pd)-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for ; [Y-Ni(Pd)-B-C]
| Crystal System: | Tetragonal |
| Formula Units per Cell: | |
| Space Group: |
I4/mmm
|
Cell Parameters
| x of Pdx (formula units) |
Temp
K
|
a
Å
|
b
Å
|
c
Å
|
| 0.0 |
296 |
3.524 |
-- |
10.519 |
| 0.2 |
296 |
3.543 |
-- |
10.579 |
| 0.5 |
296 |
3.554 |
-- |
10.639 |
| 0.7 |
296 |
3.576 |
-- |
10.639 |
| 1.0 |
296 |
3.589 |
-- |
10.649 |
| 1.2 |
296 |
3.586 |
-- |
10.638 |
Measurement Method: X-ray diffraction
"...the XRD (was measured) by the Rigaku D-MAXIII powder diffractometer..." No additional measurement details were noted.
Cautions: Unevaluated Data
Digitized data were obtained from Figure 7 of the paper.
Critical Temperature for ; [Y-Ni(Pd)-B-C]
| x of Pdx (formula units) |
Critical Temperature (K) |
| 0 |
16.3 |
| 0.2 |
14.1 |
| 0.5 |
12.2 |
| 0.7 |
12.2 |
| 1.0 |
11.8 |
| 1.2 |
11.7 |
Measurement Method: SQUID magnetometer
"...the magnetic susceptibility (was determined) by a Quantum Design SQUID magnetometer..." No additional measurement details were noted.
Cautions: Unevaluated Data
Digitized data were obtained from Figure 8 of the paper.
