NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: The Crystal Structure of Superconducting LuNi2B2C and the Related Phase LuNiBC
Author(s): T. Siegrist, H.W. Zandbergen, R.J. Cava, J.J. Krajewski, and W.F. Peck, Jr.
Publication: Nature Volume: 367 Issue: Not Available Year: 1994 Page(s): 254-256
Editor(s): Not Available
Publisher: Macmillan Magazines Ltd.
Language: English
Notes: Not Available
Keywords: Material Specification, Density (mass), Crystallography

Materials and Properties

[Lu-Ni-B-C]
Material Specification for ; [Lu-Ni-B-C] Process: Melt Processed
Notes: "Small single crystals of LuNi2B2C were grown in an arc furnace from melts with starting composition of LuNi4B2C... The crystals grew as thin platelets at the surface of the melted buttons and could be cleaved..." No additional processing details were noted.
Formula: LuNi2B2C
Informal Name:
Chemical Family: Lu-Ni-B-C
Chemical Class: Carbide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Density (mass) for ; [Lu-Ni-B-C]
Temperature (K) Density (g cm-3)
296 8.488
Measurement Method: X-ray diffraction
"Small thin fragments were then mounted on an Enraf-Nonius single-crystal diffractometer using graphite-monochromatized MoKα radiation. Data were collected in the Ω-scan mode up to 2θ=75° at an ambient temperature of 23 °C. Accurate lattice parameters were obtained by determining the absolute 2θ values at high angles of at least 35 reflections. A gaussian integration absorption correction was applied to all the intensity data measured. The structures were refined using the NRCVAX program package."

Cautions: Evaluated Data
Crystallography for ; [Lu-Ni-B-C]
Crystal System: Tetragonal
Formula Units per Cell: 2
Space Group: I4/mmm
Cell Parameters
Temp K a Å b Å c Å
296 3.4639(1) -- 10.6313(4)
Atomic Coordinates
Atom Temp K a-axis b-axis c-axis
Lu 296 0 0 0
Ni 296 0.5 0 0.25
B 296 0 0 0.3621(18)
C 296 0.5 0.5 0
Measurement Method: X-ray diffraction
"Small thin fragments were then mounted on an Enraf-Nonius single-crystal diffractometer using graphite-monochromatized MoKα radiation. Data were collected in the Ω-scan mode up to 2θ=75° at an ambient temperature of 23 °C. Accurate lattice parameters were obtained by determining the absolute 2θ values at high angles of at least 35 reflections. A gaussian integration absorption correction was applied to all the intensity data measured. The structures were refined using the NRCVAX program package."

Cautions: Evaluated Data