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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Specific-Heat Analysis of Rare-Earth Transition-Metal Borocarbides: An Estimation of the Electron-Phonon Coupling Strength
Author(s): H. Michor, T. Holubar, C. Dusek, and G. Hilscher
Publication: Physical Review B Volume: 52 Issue: 22 Year: 1995 Page(s): 16165-16175
Editor(s): Not Available
Publisher: American Physical Society
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Flux Density Hc2, Specific Heat
[Y-Ni-B-C]
[Lu-Ni-B-C]
[La-Pt(Au)-B-C]
Material Specification for ; [Y-Ni-B-C] Process: Melt Processed
Notes: The authors cite N.M. Hong et al., Physica C, Vol. 227, 85 (1994), and summarize the procedure as follows. "Polycrystalline samples of RNi2B2C were prepared by high-frequency induction melting and annealing at 1050 °C for 24-36 h. ... To improve the sample quality we varied the annealing procedure and succeeded to reduce the amount of a secondary phase of LuNi2B2C to below 1% by an extended annealing time of three weeks. According to x-ray diffraction and micrographs the improvement of phase purity of the other compounds investigated was limited by secondary phases of about 3-5%. As LaPt2B2C could not be obtained as a single-phase material we used LaPt1.5Au0.5B2C with the proper annealing conditions given by Cava et al, Physica C, Vol. 226, 170 (1994)."
Formula: YNi2B2C
Informal Name:
Chemical Family: Y-Ni-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Flux Density Hc2 for ; [Y-Ni-B-C]
Temperature (K) Crit.Mag.Flux Density Hc2 (T)
5.0 4.5
6.5 4.0
8.1 3.0
10.1 1.9
12.2 1.0
14.0 0.2
14.4 0.05
14.6 0
Measurement Method: Susceptibility methods
"Ac and dc susceptibility measurements were performed in a calibrated ac susceptometer (80 Hz and field amplitudes up to 1 mT) and in a 6 T superconducting quantum interference device magnetometer, respectively." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 3 of the paper.
Specific Heat for ; [Y-Ni-B-C]
Magnetic Field (T) Temperature (K) Specific Heat (J kg-1 K-1)
0 2.2 0.02
0 5.5 0.28
0 7.8 0.78
0 9.1 1.23
0 10.8 1.98
0 12.0 2.65
0 12.9 3.27
0 13.4 3.68
0 13.8 3.87
0 14.2 3.53
0 14.4 2.98
0 14.5 2.74
0 14.6 2.60
0 15.1 2.78
0 15.8 3.11
0.3 8.8 1.18
0.3 10.3 1.80
0.3 11.2 2.24
0.3 12.3 2.78
0.3 12.6 2.96
0.3 12.8 3.07
0.3 13.2 2.87
0.3 13.5 2.40
0.3 13.7 2.32
0.3 13.8 2.26
0.3 14.5 2.53
0.3 15.1 2.77
0.3 15.8 3.07
1 3.0 0.16
1 6.3 0.56
1 7.7 0.89
1 8.7 1.21
1 9.8 1.66
1 10.4 1.91
1 10.8 2.09
1 11.0 2.17
1 11.3 2.26
1 11.6 2.07
1 11.9 1.81
1 12.0 1.74
1 12.9 1.98
1 13.7 2.21
1 14.5 2.54
1 15.1 2.78
1 15.8 3.11
3 2.4 0.19
3 5.3 0.54
3 6.4 0.74
3 7.2 0.91
3 7.6 0.91
3 7.9 0.87
3 8.3 0.89
3 9.6 1.12
3 10.5 1.31
3 11.6 1.57
3 12.6 1.85
3 14.5 2.53
3 15.1 2.77
3 15.4 2.92
3 15.8 3.07
4 2.7 0.22
4 4.5 0.42
4 5.2 0.52
4 5.8 0.55
4 6.4 0.60
4 7.7 0.77
4 9.0 0.99
4 10.2 1.25
4 11.2 1.49
4 12.1 1.71
4 13.0 2.02
4 13.9 2.32
4 14.6 2.60
4 15.2 2.84
4 15.8 3.12
9 2.4 0.19
9 6.6 0.62
9 10.0 1.19
9 12.3 1.78
9 13.2 2.05
9 14.1 2.35
9 14.7 2.66
9 15.3 2.90
9 15.8 3.08
Measurement Method: Quasiadiabatic heating
"Specific-heat measurements up to 11 T were carried out on 2-3 g samples in three automated calorimeters using a quasiadiabatic step heating technique. In the low-temperature calorimeters (1.5-100 K) the temperature is measured either with a germanium resistor or with a carbon glass resistor for zero field and field measurements, respectively, which are situated in the bore of the sapphire sample holder. The field calibration of the latter has been performed in situ against a SrTiO3 sensor. For the upper temperature range (80-300 K) we use a thin AuAg disc as sample holder which is surrounded by two active radiation shields in cascade."

Cautions: Evaluated Data
Digitized data were obtained from Figure 1a of the paper.
Material Specification for ; [Lu-Ni-B-C] Process: Melt Processed
Notes: The authors cite N.M. Hong et al., Physica C, Vol. 227, 85 (1994), and summarize the procedure as follows. "Polycrystalline samples of RNi2B2C were prepared by high-frequency induction melting and annealing at 1050 °C for 24-36 h. ... To improve the sample quality we varied the annealing procedure and succeeded to reduce the amount of a secondary phase of LuNi2B2C to below 1% by an extended annealing time of three weeks. According to x-ray diffraction and micrographs the improvement of phase purity of the other compounds investigated was limited by secondary phases of about 3-5%. As LaPt2B2C could not be obtained as a single-phase material we used LaPt1.5Au0.5B2C with the proper annealing conditions given by Cava et al, Physica C, Vol. 226, 170 (1994)."
Formula: LuNi2B2C
Informal Name:
Chemical Family: Lu-Ni-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Flux Density Hc2 for ; [Lu-Ni-B-C]
Temperature (K) Crit.Mag.Flux Density Hc2 (T)
4.4 7.9
5.6 7.5
6.4 7.0
7.8 6.0
9.1 5.0
10.0 3.9
11.1 3.0
12.4 2.0
14.2 0.9
15.8 0.2
16.2 0.06
16.5 0
Measurement Method: Susceptibility methods
"Ac and dc susceptibility measurements were performed in a calibrated ac susceptometer (80 Hz and field amplitudes up to 1 mT) and in a 6 T superconducting quantum interference device magnetometer, respectively." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 3 of the paper.
Specific Heat for ; [Lu-Ni-B-C]
Magnetic Field (T) Temperature (K) Specific Heat (J kg-1 K-1)
0 2.6 0.01
0 8.2 0.64
0 9.2 0.94
0 10.9 1.75
0 12.3 2.71
0 13.5 3.75
0 14.7 5.20
0 15.3 6.01
0 15.6 6.18
0 16.0 5.77
0 16.1 5.50
0 16.2 5.30
0 16.5 5.26
0 17.2 5.97
0 18.4 7.22
0.3 8.3 0.75
0.3 10.1 1.47
0.3 12.1 2.62
0.3 13.5 3.75
0.3 14.4 4.75
0.3 14.7 5.02
0.3 15.2 4.53
0.3 15.4 4.42
0.3 15.8 4.46
0.3 16.5 5.26
0.3 17.3 6.06
0.3 18.3 7.22
1 3.0 0.10
1 7.2 0.53
1 9.0 1.06
1 10.6 1.78
1 12.1 2.70
1 12.9 3.33
1 13.2 3.52
1 13.7 3.28
1 14.2 3.24
1 15.3 4.16
1 16.4 5.09
1 17.3 6.06
1 18.4 7.22
3 3.0 0.15
3 6.3 0.52
3 8.6 1.08
3 9.5 1.41
3 9.8 1.50
3 10.8 1.53
3 11.2 1.58
3 12.8 2.36
3 14.5 3.42
3 16.0 4.73
3 17.1 5.85
3 18.4 7.22
5 2.6 0.16
5 4.9 0.35
5 5.6 0.50
5 6.5 0.64
5 7.3 0.72
5 8.0 0.82
5 9.3 1.03
5 10.8 1.44
5 12.3 2.13
5 13.8 2.98
5 15.0 3.90
5 16.5 5.32
5 17.5 6.33
5 18.4 7.22
9 2.6 0.16
9 8.1 0.76
9 10.7 1.43
9 12.9 2.43
9 14.8 3.67
9 16.4 5.15
9 17.6 6.28
9 18.4 7.22
Measurement Method: Quasiadiabatic heating
"Specific-heat measurements up to 11 T were carried out on 2-3 g samples in three automated calorimeters using a quasiadiabatic step heating technique. In the low-temperature calorimeters (1.5-100 K) the temperature is measured either with a germanium resistor or with a carbon glass resistor for zero field and field measurements, respectively, which are situated in the bore of the sapphire sample holder. The field calibration of the latter has been performed in situ against a SrTiO3 sensor. For the upper temperature range (80-300 K) we use a thin AuAg disc as sample holder which is surrounded by two active radiation shields in cascade."

Cautions: Evaluated Data
Digitized data were obtained from Figure 1b of the paper.
Material Specification for ; [La-Pt(Au)-B-C] Process: Melt Processed
Notes: The authors cite N.M. Hong et al., Physica C, Vol. 227, 85 (1994), and summarize the procedure as follows. "Polycrystalline samples of RNi2B2C were prepared by high-frequency induction melting and annealing at 1050 °C for 24-36 h. ... To improve the sample quality we varied the annealing procedure and succeeded to reduce the amount of a secondary phase of LuNi2B2C to below 1% by an extended annealing time of three weeks. According to x-ray diffraction and micrographs the improvement of phase purity of the other compounds investigated was limited by secondary phases of about 3-5%. As LaPt2B2C could not be obtained as a single-phase material we used LaPt1.5Au0.5B2C with the proper annealing conditions given by Cava et al, Physica C, Vol. 226, 170 (1994)."
Formula: LaPt1.5Au0.5B2C
Informal Name:
Chemical Family: La-Pt(Au)-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Flux Density Hc2 for ; [La-Pt(Au)-B-C]
Temperature (K) Crit.Mag.Flux Density Hc2 (T)
4.1 0.8
6.0 0.7
6.9 0.6
8.2 0.4
9.2 0.16
10.0 0.11
10.6 0.05
10.9 0
Measurement Method: Susceptibility methods
"Ac and dc susceptibility measurements were performed in a calibrated ac susceptometer (80 Hz and field amplitudes up to 1 mT) and in a 6 T superconducting quantum interference device magnetometer, respectively." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 3 of the paper.
Specific Heat for ; [La-Pt(Au)-B-C]
Magnetic Field (T) Temperature (K) Specific Heat (J kg-1 K-1)
0 2.2 0.01
0 5.8 0.28
0 7.4 0.60
0 8.6 1.00
0 9.7 1.47
0 10.3 1.70
0 10.6 1.78
0 10.9 1.82
0 11.4 2.05
0 11.8 2.32
0 12.1 2.43
0 12.2 2.56
9 2.2 0.04
9 6.1 0.32
9 7.5 0.61
9 9.0 1.02
9 9.9 1.40
9 10.9 1.81
9 11.6 2.21
9 11.9 2.32
9 12.2 2.54
Measurement Method: Quasiadiabatic heating
"Specific-heat measurements up to 11 T were carried out on 2-3 g samples in three automated calorimeters using a quasiadiabatic step heating technique. In the low-temperature calorimeters (1.5-100 K) the temperature is measured either with a germanium resistor or with a carbon glass resistor for zero field and field measurements, respectively, which are situated in the bore of the sapphire sample holder. The field calibration of the latter has been performed in situ against a SrTiO3 sensor. For the upper temperature range (80-300 K) we use a thin AuAg disc as sample holder which is surrounded by two active radiation shields in cascade."

Cautions: Evaluated Data
Digitized data were obtained from Figure 1c of the paper.