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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Effects of Partial Yttrium Substitution in Bi2Sr2Ca1-xYxCu2O8+z Single Crystals
Author(s): D. Hu, V. Brabers, and W.J. de Jonge
Publication: Physica C Volume: 235 Issue: Not Available Year: 1994 Page(s): 951-952
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Vol. 235-240, multivolume issue
Keywords: Material Specification, Crystallography, Critical Temperature, Critical Current Density, Magnetic Susceptibility

Materials and Properties

Bi:2212; [Bi-Sr-Ca(Y)-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca(Y)-Cu-O] Process: Floating Zone
Notes: The authors cite J. Emmen et al., J. Crystal Growth, Vol. 118, 477 (1992), and summarize the procedure as follows. "Single crystals... have been prepared by the travelling solvent floating zone method. ... For Y substituted materials the final sintering temperature of the precursor bars was increased by about 2 °C for each percent Y because of the enhancement of the melting point. ... The chemical composition of the crystals (was) measured by the electron microprobe..."
Formula: Bi2Sr2Ca1-xYxCu2O8+y
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca(Y)-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for Bi:2212; [Bi-Sr-Ca(Y)-Cu-O]
Crystal System:
Formula Units per Cell:
Space Group:
Cell Parameters
x of Yx (formula units) Temp K a Å b Å c Å
0.00 296 -- -- 30.97
0.04 296 -- -- 30.91
0.12 296 -- -- 30.90
0.20 296 -- -- 30.81
0.28 296 -- -- 30.64
0.43 296 -- -- 30.54
0.51 296 -- -- 30.41
Measurement Method: X-ray diffraction
No measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 2 of the paper.
Critical Temperature for Bi:2212; [Bi-Sr-Ca(Y)-Cu-O]
x of Yx (formula units) Critical Temperature (K)
0.00 91.6
0.04 92.6
0.12 92.5
0.20 95.5
0.28 74.6
0.43 51.8
Measurement Method: A.C. susceptibility
"...a.c. susceptibility (was measured)... The critical current density jc(T) (was) determined from the remanent magnetization using the Bean model..." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 3b of the paper.
Critical Current Density for Bi:2212; [Bi-Sr-Ca(Y)-Cu-O]
x of Yx (formula units) Temperature (K) Critical Current Density (kA/cm2)
0.0 5 2900
0.0 14 430
0.0 20 130
0.0 24 29
0.0 32 23
0.0 43 21
0.0 52 14
0.0 59 9.3
0.0 65 3.6
0.0 69 2.9
0.0 78 1.3
0.0 85 0.82
0.0 87 0.57
0.0 87 0.40
0.0 89 0.19
0.20 6 1200
0.20 14 220
0.20 21 52
0.20 24 23
0.20 29 21
0.20 31 18
0.20 37 16
0.20 44 13
0.20 53 10
0.20 61 7.5
0.20 65 6.4
0.20 70 6.0
0.20 75 4.1
0.20 81 2.3
0.20 87 1.6
0.20 92 1.3
0.20 96 0.65
0.28 6 970
0.28 12 220
0.28 21 48
0.28 26 25
0.28 34 18
0.28 40 12
0.28 46 7.6
0.28 48 5.3
0.28 51 3.4
0.28 57 1.4
0.28 60 0.90
0.28 61 0.67
0.28 66 0.40
0.28 70 0.24
0.28 75 0.17
0.43 6 87
0.43 9 42
0.43 15 16
0.43 19 6.3
0.43 22 3.2
0.43 27 1.9
0.43 30 1.2
0.43 32 1.0
0.43 37 0.86
0.43 39 0.69
0.43 42 0.55
0.43 47 0.44
0.43 51 0.44
0.43 56 0.35
0.43 59 0.33
0.43 63 0.28
0.43 64 0.23
0.43 69 0.18
0.43 70 0.18
0.43 71 0.16
0.43 73 0.14
0.43 74 0.12
0.43 75 0.12
Measurement Method: A.C. susceptibility
"...a.c. susceptibility (was measured)... The critical current density jc(T) (was) determined from the remanent magnetization using the Bean model..." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 4 of the paper.
Magnetic Susceptibility for Bi:2212; [Bi-Sr-Ca(Y)-Cu-O]
x of Yx (formula units) Temperature (K) Magnetic Susceptibility (arbitrary)
0.0 55 -1.00
0.0 81 -1.00
0.0 84 -0.99
0.0 87 -0.94
0.0 90 -0.83
0.0 90 -0.74
0.0 91 -0.46
0.12 60 -1.00
0.12 82 -0.99
0.12 90 -0.95
0.12 90 -0.92
0.12 91 -0.84
0.12 93 -0.70
0.12 94 -0.59
0.12 94 -0.34
0.12 94 -0.17
0.12 96 -0.09
0.20 31 -1.00
0.20 51 -0.99
0.20 64 -0.97
0.20 81 -0.94
0.20 87 -0.87
0.20 89 -0.72
0.20 91 -0.52
0.20 91 -0.36
0.20 91 -0.21
0.20 92 -0.07
0.28 11 -1.00
0.28 20 -1.00
0.28 30 -0.98
0.28 42 -0.95
0.28 53 -0.87
0.28 59 -0.75
0.28 66 -0.56
0.28 71 -0.36
0.28 73 -0.27
0.28 75 -0.21
0.28 82 -0.16
0.28 85 -0.11
0.28 88 -0.05
0.28 92 -0.01
0.28 96 0.00
0.28 100 0.00
0.43 11 -0.99
0.43 22 -0.91
0.43 32 -0.80
0.43 39 -0.61
0.43 42 -0.46
0.43 45 -0.36
0.43 47 -0.27
0.43 50 -0.20
0.43 60 -0.14
0.43 72 -0.12
0.43 82 -0.08
0.43 88 -0.03
0.43 94 0.00
0.43 100 0.00
0.51 11 -0.93
0.51 14 -0.86
0.51 18 -0.81
0.51 23 -0.78
0.51 27 -0.72
0.51 34 -0.59
0.51 40 -0.47
0.51 42 -0.40
0.51 47 -0.34
0.51 53 -0.23
0.51 55 -0.19
0.51 56 -0.13
0.51 59 -0.13
0.51 61 -0.13
0.51 66 -0.05
0.51 71 0.00
0.51 80 0.0
0.51 90 0.0
0.51 100 0.0
Measurement Method: A.C. susceptibility
"...a.c. susceptibility (was measured)... The critical current density jc(T) (was) determined from the remanent magnetization using the Bean model..." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 3a of the paper.