NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: BSCCO-2212 Single Crystal Tc Enhancement Induced by Y-Doping
Author(s): A.P. MacKenzie, Y.F. Orekhov, and V.N. Zavaritsky
Publication: Physica C Volume: 235 Issue: Not Available Year: 1994 Page(s): 529-530
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Vol. 235-240, multivolume issue
Keywords: Material Specification, Critical Temperature

Materials and Properties

Bi:2212; [Bi-Sr-Ca(Y)-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca(Y)-Cu-O] Process: Solid State Reaction
Notes: The authors cite N.V. Zavaritsky et al., Physica C, Vol. 169, 174 (1990), and summarize the procedure as follows. "Flat flakes with the thickness of about 6-20 µm cleaved from BSCCO single crystals with the nominal 2212 composition grown in the Kapitza Institute by a standard two-step solid state reaction method in yttrium-stabilized zirconium crucibles are studied. We assume the crucibles are studied. We assume the crucible material to be the origin of the yttrium contamination... electron probe microanalysis... (was) performed on the crystals... the compositional analysis was performed on two points on each of 87 selected crystals and the atomic amount of the constituting elements was determined."
Formula: Bi2Sr2Ca1-xYxCu2Oy
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca(Y)-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Temperature for Bi:2212; [Bi-Sr-Ca(Y)-Cu-O]
x of Yx (formula units) Yttrium Distribution () Critical Temperature (K)
0.002 homogeneous 86.1
0.002 homogeneous 86.7
0.011 homogeneous 87.1
0.018 homogeneous 89.1
0.016 homogeneous 89.7
0.098 homogeneous 93.0
0.140 homogeneous 93.9
0.234 homogeneous 81.8
0.231 homogeneous 83.5
0.250 homogeneous 82.7
0.250 homogeneous 85.8
0.277 homogeneous 78.0
0.279 homogeneous 77.7
0.018 clustered 87.7
0.046 clustered 91.4
0.096 clustered 93.2
0.140 clustered 93.8
0.149 clustered 93.8
0.147 clustered 92.6
0.188 clustered 87.9
0.190 clustered 87.1
0.208 clustered 84.2
Measurement Method: Four-probe method
"Transport properties were studied by resistance measurements using a standard four probe method. Electrical contacts for these measurements were made using silver epoxy fired at (520-550) °C in flowing oxygen, the typical value of the contact resistance was (1-5) Ω. Contacts to the crystal were usually placed on both sides of the sample."

Cautions: Evaluated Data
Digitized data were obtained from Figure 2 of the paper.