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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Structural, Superconducting, and Magnetic Properties of YNi2B2C and ErNi2B2C
Author(s): C. Godart, L.C. Gupta, R. Nagarajan, S.K. Dhar, H. Noel, M. Potel, C. Mazumdar, Z. Hossain, C.L. Clement, et al.
Publication: Physical Review B Volume: 51 Issue: 1 Year: 1995 Page(s): 489-496
Editor(s): Not Available
Publisher: American Physical Society
Language: English
Notes: et al.= G. Schiffmacher, B.D. Padalia, R. Vijayaraghavan
Keywords: Material Specification, Crystallography, Critical Temperature, Critical Flux Density Hc2, Resistivity (normal state), Specific Heat, Critical Flux Density Hc1

Materials and Properties

[Y-Ni-B-C]
[Er-Ni-B-C]
[Ho-Ni-B-C]
[Tm-Ni-B-C]
Material Specification for ; [Y-Ni-B-C] Process: Melt Processed
Notes: "The two compounds YNi2B2C and ErNi2B2C were prepared by melting high purity elements Y (99.9%), Er (99.9%), Ni (99.9%), B (99.8%), and C (99.7%) in an arc furnace under a protective atmosphere of flowing argon. Samples, sealed in quartz ampoules under vacuum, were annealed at 1050 °C for 12 h and cooled to room temperature over a period of 5 h. We also prepared the materials RNi2B2C (R = Ho, Tm)..."
Formula: YNi2B2
Informal Name:
Chemical Family: Y-Ni-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for ; [Y-Ni-B-C]
Cell Parameters
Crystal System: Tetragonal
Formula Units per Cell: 2
Space Group: I4/mmm
Cell Parameters
Temp K a Å b Å c Å
300 3.524(1) -- 10.545(5)
50 3.521(1) -- 10.549(5)
Measurement Method: X-ray diffraction
"Room temperature x-ray diffraction measurements on polycrystalline samples were performed using a Jeol JDX-8030 automatic diffractometer. DIFFRACT-AT software and JCPDS files have been used to check for impurity phases. Low temperature x-ray measurements on YNi2B2C were performed using Siemens Kristalloflex diffractometer (Co tube) with a He-TTK low temperature attachment. Structural analysis was carried out on a YNi2B2C single crystal (0.06 x 0.06 x 0.015 mm3) using a Enraf-Nonius four-axis goniometer. ... Structural analysis of a single crystal of YNi2B2C was carried out in which 333 x-ray reflections were measured. Out of them, 190 reflections were independent."

Cautions: Evaluated Data
Critical Temperature for ; [Y-Ni-B-C]
Transition Width (K) Critical Temperature (K)
0.5 15.3
Measurement Method: Four-probe resistance
"The resistivity of the two samples was measured using the standard four-probe technique. ... We have determined the variation of H (T) with temperature from magnetoresistance measurements." No additional measurement details were noted.

Cautions: Unevaluated Data
Critical Flux Density Hc2 for ; [Y-Ni-B-C]
Temperature (K) Crit.Mag.Flux Density Hc2 (T)
4.9 4.5
8.0 2.9
10.0 2.0
10.8 1.0
11.9 0.71
12.8 0.49
13.7 0.18
14.2 0.09
14.8 0.04
15.2 0.00
Measurement Method: Four-probe resistance
"The resistivity of the two samples was measured using the standard four-probe technique. ... We have determined the variation of H (T) with temperature from magnetoresistance measurements." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 6 of the paper.
Resistivity (normal state) for ; [Y-Ni-B-C]
Temperature (K) Resistivity (normal state) (mΩ·cm)
6.0 0.000
10.0 0.000
15.1 0.001
15.7 0.005
20.0 0.006
Measurement Method: Four-probe resistance
"The resistivity of the two samples was measured using the standard four-probe technique. ... We have determined the variation of H (T) with temperature from magnetoresistance measurements." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 2 (inset) of the paper.
Specific Heat for ; [Y-Ni-B-C]
Temperature (K) Specific Heat (J kg-1 K-1)
4.0 85
8.7 1050
11.0 2250
13.0 3300
13.6 3450
14.5 3350
15.5 3230
17.5 4360
19.2 5580
20.7 7010
22.2 8920
23.5 10200
24.9 12200
Measurement Method: Heat pulse
"Specific-heat measurements were carried out between 2 K and 25 K in a home-built automated calorimeter using the semiadiabatic heat pulse technique." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 9 of the paper.
Critical Flux Density Hc1 for ; [Y-Ni-B-C]
Temperature (K) Crit.Mag.Flux Density Hc1 (mT)
5 3
Measurement Method: SQUID magnetometer
"The magnetic response as a function of temperature (zero field and field cooled configuration) and as a function of field were studied using a superconducting quantum interference device (SQUID) magnetometer (Quantum Design Inc.)... H (T) is the field at which M(H,T) deviates from linearity." No additional measurement details were noted.

Cautions: Unevaluated Data
Material Specification for ; [Er-Ni-B-C] Process: Melt Processed
Notes: "The two compounds YNi2B2C and ErNi2B2C were prepared by melting high purity elements Y (99.9%), Er (99.9%), Ni (99.9%), B (99.8%), and C (99.7%) in an arc furnace under a protective atmosphere of flowing argon. Samples, sealed in quartz ampoules under vacuum, were annealed at 1050 °C for 12 h and cooled to room temperature over a period of 5 h. We also prepared the materials RNi2B2C (R = Ho, Tm)..."
Formula: ErNi2B2C
Informal Name:
Chemical Family: Er-Ni-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for ; [Er-Ni-B-C]
Crystal System: Tetragonal
Formula Units per Cell: 2
Space Group: I4/mmm
Cell Parameters
Temp K a Å b Å c Å
300 3.503(1) -- 10.560(5)
Measurement Method: X-ray diffraction
"Room temperature x-ray diffraction measurements on polycrystalline samples were performed using a Jeol JDX-8030 automatic diffractometer. DIFFRACT-AT software and JCPDS files have been used to check for impurity phases. Low temperature x-ray measurements on YNi2B2C were performed using Siemens Kristalloflex diffractometer (Co tube) with a He-TTK low temperature attachment. Structural analysis was carried out on a YNi2B2C single crystal (0.06 x 0.06 x 0.015 mm3) using a Enraf-Nonius four-axis goniometer. ... Structural analysis of a single crystal of YNi2B2C was carried out in which 333 x-ray reflections were measured. Out of them, 190 reflections were independent."

Cautions: Evaluated Data
Critical Temperature for ; [Er-Ni-B-C]
Transition Width (K) Critical Temperature (K)
0.5 10.3
Measurement Method: Four-probe resistance
"The resistivity of the two samples was measured using the standard four-probe technique. ... We have determined the variation of H (T) with temperature from magnetoresistance measurements." No additional measurement details were noted.

Cautions: Unevaluated Data
Resistivity (normal state) for ; [Er-Ni-B-C]
Temperature (K) Resistivity (normal state) (mΩ·cm)
6.0 0.000
9.7 0.000
10.3 0.003
10.8 0.009
10.8 0.015
11.9 0.016
15.7 0.016
20.0 0.017
Measurement Method: Four-probe resistance
"The resistivity of the two samples was measured using the standard four-probe technique. ... We have determined the variation of H (T) with temperature from magnetoresistance measurements." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 2 (inset) of the paper.
Specific Heat for ; [Er-Ni-B-C]
Temperature (K) Specific Heat (J kg-1 K-1)
2.4 18.6
4.0 67.5
5.3 161
5.8 222
6.5 188
7.1 150
7.8 111
9.8 125
10.5 122
12.1 152
13.6 170
16.3 293
19.1 447
21.1 561
24.6 816
Measurement Method: Heat pulse
"Specific-heat measurements were carried out between 2 K and 25 K in a home-built automated calorimeter using the semiadiabatic heat pulse technique." No additional measurement details were noted.

Cautions: Unevaluated Data
Digitized data were obtained from Figure 10 of the paper.
Material Specification for ; [Ho-Ni-B-C] Process: Melt Processed
Notes: "The two compounds YNi2B2C and ErNi2B2C were prepared by melting high purity elements Y (99.9%), Er (99.9%), Ni (99.9%), B (99.8%), and C (99.7%) in an arc furnace under a protective atmosphere of flowing argon. Samples, sealed in quartz ampoules under vacuum, were annealed at 1050 °C for 12 h and cooled to room temperature over a period of 5 h. We also prepared the materials RNi2B2C (R = Ho, Tm)..."
Formula: HoNi2B2C
Informal Name:
Chemical Family: Ho-Ni-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for ; [Ho-Ni-B-C]
Crystal System: Tetragonal
Formula Units per Cell: 2
Space Group: I4/mmm
Cell Parameters
Temp K a Å b Å c Å
300 3.513(1) -- 10.525(3)
Measurement Method: X-ray diffraction
"Room temperature x-ray diffraction measurements on polycrystalline samples were performed using a Jeol JDX-8030 automatic diffractometer. DIFFRACT-AT software and JCPDS files have been used to check for impurity phases. Low temperature x-ray measurements on YNi2B2C were performed using Siemens Kristalloflex diffractometer (Co tube) with a He-TTK low temperature attachment. Structural analysis was carried out on a YNi2B2C single crystal (0.06 x 0.06 x 0.015 mm3) using a Enraf-Nonius four-axis goniometer. ... Structural analysis of a single crystal of YNi2B2C was carried out in which 333 x-ray reflections were measured. Out of them, 190 reflections were independent."

Cautions: Evaluated Data
Material Specification for ; [Tm-Ni-B-C] Process: Melt Processed
Notes: "The two compounds YNi2B2C and ErNi2B2C were prepared by melting high purity elements Y (99.9%), Er (99.9%), Ni (99.9%), B (99.8%), and C (99.7%) in an arc furnace under a protective atmosphere of flowing argon. Samples, sealed in quartz ampoules under vacuum, were annealed at 1050 °C for 12 h and cooled to room temperature over a period of 5 h. We also prepared the materials RNi2B2C (R = Ho, Tm)..."
Formula: TmNi2B2C
Informal Name:
Chemical Family: Tm-Ni-B-C
Chemical Class: Carbide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for ; [Tm-Ni-B-C]
Crystal System: Tetragonal
Formula Units per Cell: 2
Space Group: I4/mmm
Cell Parameters
Temp K a Å b Å c Å
300 3.485(1) -- 10.591(3)
Measurement Method: X-ray diffraction
"Room temperature x-ray diffraction measurements on polycrystalline samples were performed using a Jeol JDX-8030 automatic diffractometer. DIFFRACT-AT software and JCPDS files have been used to check for impurity phases. Low temperature x-ray measurements on YNi2B2C were performed using Siemens Kristalloflex diffractometer (Co tube) with a He-TTK low temperature attachment. Structural analysis was carried out on a YNi2B2C single crystal (0.06 x 0.06 x 0.015 mm3) using a Enraf-Nonius four-axis goniometer. ... Structural analysis of a single crystal of YNi2B2C was carried out in which 333 x-ray reflections were measured. Out of them, 190 reflections were independent."

Cautions: Evaluated Data