NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Ic measurement
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1991 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 58
Keywords: Material Specification, Critical Current Density

Materials and Properties

Bi:2223; [Bi-Sr-Ca-Cu-O]
Material Specification for Bi:2223; [Bi-Sr-Ca-Cu-O] Process:
Notes:
Formula: Bi2Sr2Ca2Cu3O10
Informal Name: Bi:2223
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BDKBH
Production Form: Disk

Critical Current Density for Bi:2223; [Bi-Sr-Ca-Cu-O]
Critical Current Density (kA/cm2)
0.632
Measurement Method: Resistivity
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: R220 lab., Chyuo Kenkyusyo Start date: 11-Mar-87 Environment temperature (avg): 21 °C Environment humidity (avg): 38 % Specimen shape: disk Specimen size: 17.455 mm x 1.068 mm Specimen weight: 1.37 g Specimen holding: clipping Specimen cutting: using a diamond cutter, n-hexanoic acid as coolant, speed 300 RPM, cutting four specimens for Jc measurement from one bulk sample Material of electrode: copper Electrode size: 10 mm x 25 mm Maker of electrode: self-made Electrode contact method: indium soldering (using an ultrasonic soldering iron) Distance between voltage electrodes: 5 mm Lead line: copper Temperature control: soaked in liquid N2 Test temperature: 77 K Data derivation method: defining the measured current that induced 1 µV/cm voltage as Ic, measuring cross area (S) with a micrometer, Jc = Ic/S

Cautions: Research Data