NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Measurement of critical temperature (Tc)
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1991 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 85,86
Keywords: Material Specification, Critical Temperature, Resistivity (normal state)

Materials and Properties

Bi:2212; [Bi-Sr-Ca-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca-Cu-O] Process:
Notes:
Formula: Bi2Sr2CaCu2O8
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: ADKBLM3
Production Form:
Critical Temperature for Bi:2212; [Bi-Sr-Ca-Cu-O]
Critical Temperature (K)
83
Measurement Method: Resistivity
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: Rm. 214, Main Bldg. Start date: 19-Mar-87 Environment temperature (avg): 23 °C Environment humidity (avg): 55 % Test equipment: electrical resistance equipment made by Tokyo Industry Co. Definition of Tc: defining the temperature at which voltage became 1 µV/cm as Tc(end) Cooling rate: 3 K/min Test environment: 0.1 MPa (1 atm) He gas

Cautions: Research Data
Resistivity (normal state) for Bi:2212; [Bi-Sr-Ca-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
150 1.184
149 1.177
148 1.170
147 1.163
146 1.157
145 1.150
144 1.144
143 1.139
142 1.134
141 1.127
140 1.121
139 1.114
138 1.109
137 1.102
136 1.0940
135 1.0893
134 1.0839
133 1.0765
132 1.0697
131 1.0630
130 1.0555
129 1.0476
128 1.0411
127 1.0347
126 1.0279
125 1.0233
124 1.0148
123 1.00868
122 1.00173
121 0.997
120 0.989
119 0.982
118 0.976
117 0.969
116 0.962
115 0.955
114 0.947
113 0.938
112 0.928
111 0.917
110 0.906
109 0.895
108 0.884
107 0.875
106 0.865
105 0.857
104 0.848
103 0.838
102 0.828
101 0.818
100 0.807
99 0.796
98 0.783
97 0.771
96 0.758
95 0.739
94 0.720
93 0.700
92 0.669
91 0.623
90 0.552
89 0.440
88 0.285
87 0.136
86 0.0489
85 0.0131
84 0.00206
83 0.000165
82 0.000165
81 0.000165
Measurement Method: Resistivity
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: Rm. 214, Main Bldg. Start date: 19-Mar-87 Environment temperature (avg): 23 °C Environment humidity (avg): 55 % Test equipment: electrical resistance equipment made by Tokyo Industry Co. Definition of Tc: defining the temperature at which voltage became 1 µV/cm as Tc(end) Cooling rate: 3 K/min Test environment: 0.1 MPa (1 atm) He gas

Cautions: Research Data