NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Measurement of critical temperature (Tc)
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1991 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 97,98
Keywords: Material Specification, Critical Temperature, Resistivity (normal state)

Materials and Properties

Bi:2212; [Bi-Sr-Ca-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca-Cu-O] Process:
Notes:
Formula: Bi2Sr2CaCu2O8
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: FMDBL
Production Form:

Critical Temperature for Bi:2212; [Bi-Sr-Ca-Cu-O]
Critical Temperature (K)
64
Measurement Method: Resistivity (DC four-probe)
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: Rm. 214, Main Bldg. Start date: 12-Mar-87 Environment temperature (avg): 23 °C Environment humidity (avg): 55 % Test equipment: electrical resistance equipment made by Tokyo Industry Co. Definition of Tc: defining the temperature at which voltage became 1 µV/cm as Tc(end) Cooling rate: 3 K/min Test environment: 0.1 MPa (1 atm) He gas

Cautions: Research Data
Resistivity (normal state) for Bi:2212; [Bi-Sr-Ca-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
100 0.0881
99 0.0875
98 0.0868
97 0.0860
96 0.0853
95 0.0845
94 0.0838
93 0.08290
92 0.0819
91 0.0809
90 0.0798
89 0.0786
88 0.0771
87 0.0754
86 0.0732
85 0.0705
84 0.0672
83 0.0637
82 0.0594
81 0.0544
80 0.0485
79 0.0419
78 0.0352
77 0.0295
76 0.0257
75 0.0229
74 0.0205
73 0.0180
72 0.0154
71 0.0127
70 0.00969
69 0.00647
68 0.00326
67 0.00121
66 0.000364
65 0.000069
64 0.000007
63 0.000003
62 0.000007
61 0.000005
60 0.000006
59 0.000005
58 0.000006
57 0.000003
56 0.000005
55 0.000004
Measurement Method: Resistivity (DC four-probe)
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: Rm. 214, Main Bldg. Start date: 12-Mar-87 Environment temperature (avg): 23 °C Environment humidity (avg): 55 % Test equipment: electrical resistance equipment made by Tokyo Industry Co. Definition of Tc: defining the temperature at which voltage became 1 µV/cm as Tc(end) Cooling rate: 3 K/min Test environment: 0.1 MPa (1 atm) He gas

Cautions: Research Data