NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: X-ray diffraction
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1991 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 519
Keywords: Material Specification, Crystallography

Materials and Properties

Bi:2212; [Bi-Sr-Ca-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca-Cu-O] Process:
Notes:
Formula: Bi2Sr2CaCu2O8
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BMKBL9
Production Form: Disk
Crystallography for Bi:2212; [Bi-Sr-Ca-Cu-O]
Crystal System:
Formula Units per Cell:
Space Group:
Cell Parameters
Temp K a Å b Å c Å
296 5.412(1) 5.407(2) 30.887(4)
Measurement Method: X-ray diffraction (XRD)
Test facility: 3rd Lab., Dept. of Structural Chemistry, Tore Research Center Location: X-ray Lab., Dept. of Structural Chemistry, Tore Research Center Start date: 18-May-91 Environment temperature (avg): 23 °C Environment humidity (avg): 60 % Laboratory environment: air conditioned Specimen shape: disk Specimen weight: 0.5 g Specimen holding: using an alumina holder Specimen treatment: powdering, < 100 mesh X-ray source: Cu Kα Applied voltage: 40 kV Applied current: 100 mA Monochrometer: graphite Incident slit: 1°- 0.15 mm - 1° Scanning range (2-θ): 3 - 75 degree sweep rate: 3 degree/min test temperature: room temperature

Cautions: