Hts Logo

NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Measurement of critical temperature (four-probe)
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1074-1077
Keywords: Material Specification, Resistivity (normal state)

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Y:123; [Y-Ba-Cu-O]
Y:123; [Y-Ba-Cu-O]
Y:123; [Y-Ba-Cu-O]
Y:123; [Y-Ba-Cu-O]
Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BHK69Y
Production Form:

Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
93.1 0.04
93.7 0.04
94.3 0.07
95.0 0.13
95.6 0.22
96.2 0.34
96.9 0.40
97.5 0.48
98.1 0.55
98.7 0.60
99.4 0.63
100.0 0.63
100.6 0.63
101.3 0.64
101.9 0.64
102.5 0.65
103.1 0.65
103.8 0.66
104.4 0.66
105.0 0.67
105.7 0.67
106.3 0.67
106.9 0.68
107.6 0.69
108.2 0.69
108.8 0.69
109.4 0.70
110.1 0.71
110.7 0.71
111.3 0.72
112.0 0.72
112.6 0.72
113.2 0.73
113.8 0.73
114.5 0.73
115.1 0.74
115.7 0.74
116.4 0.74
117.0 0.74
117.6 0.75
118.3 0.75
118.9 0.75
119.5 0.76
120.1 0.76
120.8 0.76
121.4 0.77
122.0 0.77
122.7 0.78
123.3 0.78
123.9 0.78
124.5 0.78
125.2 0.78
125.8 0.78
126.4 0.79
127.1 0.79
127.7 0.79
128.3 0.80
129.0 0.80
129.6 0.80
130.2 0.80
130.8 0.81
131.5 0.81
132.1 0.82
132.7 0.82
133.4 0.83
134.0 0.83
134.6 0.83
135.2 0.83
135.9 0.84
136.5 0.84
137.1 0.84
137.8 0.84
138.4 0.84
139.0 0.85
139.7 0.85
140.3 0.86
140.9 0.86
141.5 0.86
142.2 0.86
142.8 0.87
143.4 0.87
144.1 0.87
144.7 0.87
145.3 0.87
145.9 0.88
146.6 0.88
147.2 0.88
147.8 0.88
148.5 0.88
149.1 0.89
149.7 0.89
150.4 0.89
151.0 0.89
151.6 0.89
152.2 0.89
152.9 0.89
153.5 0.89
154.1 0.89
154.8 0.89
155.4 0.90
Measurement Method: Resistivity (4-probe)
Test facility: Hitachi Research Laboratory, Hitachi, Ltd. Location: Central Lab., Hitachi Kenkyu-syo Start date: 3/13/94 Weekday: Monday Start time: 8:10 End date: 3/17/94 Eeekday: Friday End time: 20:00 Environment temperature (max): 20 °C Environment humidity (max): 60 % Laboratory environment: air conditioned Test equipment: DVM; personal computer; printer; power source Specimen shape: thin film Specimen width: 2.2 mm Specimen thickness: 1.1 mm Material of current electrode: indium ultrasonic wave solder Distance between current electrodes: 9.5 mm Material of voltage electrode: Ag paste (110 °C, 10 min drying) Specimen treatment: being cut using a dry diamond cutter Electrode: Cu wire Test environment: He Applied current (avg): 10 mA Cooling rate (avg): 250 K/h Data definition: onset Data definition: middle point Data definition: zero resistance temperature

Cautions: Research Data
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.6
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BHK66Y
Production Form:

Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
91.8 0.18
93.4 0.18
95.1 0.68
96.8 1.01
98.4 1.09
100.1 1.12
101.8 1.17
103.4 1.19
105.1 1.22
106.8 1.25
108.4 1.27
110.1 1.3
111.8 1.31
113.4 1.33
115.1 1.34
116.8 1.36
118.4 1.37
120.1 1.38
121.8 1.4
123.4 1.42
125.1 1.43
126.8 1.46
128.4 1.47
130.1 1.5
131.7 1.5
133.4 1.52
135.1 1.53
136.7 1.55
138.4 1.56
140.1 1.57
141.7 1.59
143.4 1.6
145.1 1.61
146.7 1.62
148.4 1.63
150.1 1.65
151.7 1.66
153.4 1.66
155.1 1.68
156.7 1.69
158.4 1.7
160.1 1.72
161.7 1.73
163.4 1.74
165.1 1.75
166.7 1.77
168.4 1.77
170.1 1.79
171.7 1.81
173.4 1.82
175 1.82
176.7 1.83
178.4 1.83
180 1.84
181.7 1.86
183.4 1.86
185 1.87
186.7 1.87
188.4 1.88
190 1.89
191.7 1.9
193.4 1.92
195 1.92
196.7 1.94
198.4 1.95
200 1.95
201.7 1.96
203.4 1.96
205 1.97
206.7 1.97
208.4 1.98
210 1.99
211.7 2
213.4 2.01
215 2.01
216.7 2.03
218.3 2.04
220 2.04
221.7 2.05
223.3 2.06
225 2.06
226.7 2.08
228.3 2.09
230 2.09
231.7 2.09
233.3 2.1
235 2.11
236.7 2.12
238.3 2.13
240 2.13
241.7 2.13
243.3 2.16
245 2.16
246.7 2.17
248.3 2.17
250 2.18
251.7 2.19
253.3 2.2
255 2.21
256.7 2.21
Measurement Method: Resistivity (4-probe)
Test facility: Hitachi Research Laboratory, Hitachi, Ltd. Location: Central Lab., Hitachi Kenkyu-syo Start date: 3/13/94 Weekday: Monday Start time: 8:10 End date: 3/17/94 Eeekday: Friday End time: 20:00 Environment temperature (max): 20 °C Environment humidity (max): 60 % Laboratory environment: air conditioned Test equipment: DVM; personal computer; printer; power source Specimen shape: thin film Specimen width: 2.2 mm Specimen thickness: 1.1 mm Material of current electrode: indium ultrasonic wave solder Distance between current electrodes: 9.5 mm Material of voltage electrode: Ag paste (110 °C, 10 min drying) Specimen treatment: being cut using a dry diamond cutter Electrode: Cu wire Test environment: He Applied current (avg): 10 mA Cooling rate (avg): 250 K/h Data definition: onset Data definition: middle point Data definition: zero resistance temperature

Cautions: Research Data
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BDK69Y
Production Form:

Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
93.5 0.04
95 0.08
96.5 0.22
98 0.32
99.5 0.38
100.9 0.41
102.4 0.42
103.9 0.43
105.4 0.44
106.9 0.45
108.4 0.45
109.9 0.46
111.4 0.47
112.9 0.48
114.4 0.48
115.9 0.49
117.4 0.49
118.9 0.5
120.4 0.51
121.9 0.52
123.4 0.52
124.8 0.53
126.3 0.53
127.8 0.54
129.3 0.55
130.8 0.55
132.3 0.56
133.8 0.57
135.3 0.57
136.8 0.58
138.3 0.58
139.8 0.59
141.3 0.59
142.8 0.6
144.3 0.6
145.8 0.61
147.3 0.61
148.7 0.62
150.2 0.62
151.7 0.63
153.2 0.63
154.7 0.64
156.2 0.64
157.7 0.65
159.2 0.65
160.7 0.65
162.2 0.66
163.7 0.66
165.2 0.67
166.7 0.68
168.2 0.68
169.7 0.68
171.2 0.68
172.6 0.69
174.1 0.69
175.6 0.7
177.1 0.7
178.6 0.7
180.1 0.71
181.6 0.72
183.1 0.72
184.6 0.72
186.1 0.72
187.6 0.73
189.1 0.74
190.6 0.74
192.1 0.74
193.6 0.74
195.1 0.75
196.5 0.75
198 0.76
199.5 0.76
201 0.76
202.5 0.76
204 0.77
205.5 0.77
207 0.77
208.5 0.78
210 0.78
211.5 0.78
213 0.79
214.5 0.79
216 0.8
217.5 0.8
219 0.8
220.4 0.81
221.9 0.81
223.4 0.81
224.9 0.82
226.4 0.82
227.9 0.82
229.4 0.83
230.9 0.83
232.4 0.84
233.9 0.84
235.4 0.84
236.9 0.85
238.4 0.85
239.9 0.85
241.4 0.85
Measurement Method: Resistivity (4-probe)
Test facility: Hitachi Research Laboratory, Hitachi, Ltd. Location: Central Lab., Hitachi Kenkyu-syo Start date: 3/13/94 Weekday: Monday Start time: 8:10 End date: 3/17/94 Eeekday: Friday End time: 20:00 Environment temperature (max): 20 °C Environment humidity (max): 60 % Laboratory environment: air conditioned Test equipment: DVM; personal computer; printer; power source Specimen shape: thin film Specimen width: 2.2 mm Specimen thickness: 1.1 mm Material of current electrode: indium ultrasonic wave solder Distance between current electrodes: 9.5 mm Material of voltage electrode: Ag paste (110 °C, 10 min drying) Specimen treatment: being cut using a dry diamond cutter Electrode: Cu wire Test environment: He Applied current (avg): 10 mA Cooling rate (avg): 250 K/h Data definition: onset Data definition: middle point Data definition: zero resistance temperature

Cautions: Research Data
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BSK69Y
Production Form:

Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
91.8 0.03
93.6 0.04
95.4 0.19
97.2 0.32
99 0.35
100.8 0.36
102.6 0.37
104.4 0.39
106.2 0.39
108 0.41
109.8 0.41
111.6 0.42
113.4 0.43
115.2 0.44
117 0.44
118.8 0.45
120.6 0.46
122.4 0.47
124.2 0.47
126 0.48
127.8 0.48
129.6 0.49
131.4 0.49
133.2 0.5
135 0.51
136.8 0.51
138.7 0.52
140.5 0.53
142.3 0.53
144.1 0.54
145.9 0.54
147.7 0.55
149.5 0.55
151.3 0.56
153.1 0.56
154.9 0.57
156.7 0.57
158.5 0.58
160.3 0.58
162.1 0.59
163.9 0.59
165.7 0.6
167.5 0.6
169.3 0.61
171.1 0.61
172.9 0.62
174.7 0.62
176.5 0.62
178.3 0.63
180.1 0.63
181.9 0.63
183.7 0.64
185.5 0.64
187.3 0.65
189.1 0.65
190.9 0.65
192.7 0.66
194.5 0.66
196.3 0.66
198.1 0.67
199.9 0.67
201.7 0.68
203.5 0.68
205.4 0.68
207.2 0.69
209 0.69
210.8 0.7
212.6 0.7
214.4 0.71
216.2 0.71
218 0.71
219.8 0.72
221.6 0.73
223.4 0.73
225.2 0.74
227 0.74
228.8 0.74
230.6 0.75
232.4 0.75
234.2 0.75
236 0.75
237.8 0.76
239.6 0.76
241.4 0.77
243.2 0.77
245 0.78
246.8 0.78
248.6 0.78
250.4 0.79
252.2 0.79
254 0.79
255.8 0.8
257.6 0.8
259.4 0.81
261.2 0.81
263 0.82
264.8 0.82
266.6 0.83
268.4 0.83
270.3 0.83
Measurement Method: Resistivity (4-probe)
Test facility: Hitachi Research Laboratory, Hitachi, Ltd. Location: Central Lab., Hitachi Kenkyu-syo Start date: 3/13/94 Weekday: Monday Start time: 8:10 End date: 3/17/94 Eeekday: Friday End time: 20:00 Environment temperature (max): 20 °C Environment humidity (max): 60 % Laboratory environment: air conditioned Test equipment: DVM; personal computer; printer; power source Specimen shape: thin film Specimen width: 2.2 mm Specimen thickness: 1.1 mm Material of current electrode: indium ultrasonic wave solder Distance between current electrodes: 9.5 mm Material of voltage electrode: Ag paste (110 °C, 10 min drying) Specimen treatment: being cut using a dry diamond cutter Electrode: Cu wire Test environment: He Applied current (avg): 10 mA Cooling rate (avg): 250 K/h Data definition: onset Data definition: middle point Data definition: zero resistance temperature

Cautions: Research Data
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BMK69Y
Production Form:

Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
89 0.05
90.8 0.08
92.7 0.14
94.6 0.26
96.4 0.38
98.3 0.63
100.1 0.76
102 0.8
103.8 0.82
105.7 0.83
107.6 0.86
109.4 0.86
111.3 0.88
113.1 0.9
115 0.91
116.8 0.93
118.7 0.93
120.6 0.93
122.4 0.95
124.3 0.96
126.1 0.97
128 0.98
129.8 1.01
131.7 1.01
133.6 1.02
135.4 1.04
137.3 1.05
139.1 1.06
141 1.06
142.8 1.06
144.7 1.08
146.6 1.08
148.4 1.08
150.3 1.09
152.1 1.11
154 1.12
155.9 1.13
157.7 1.13
159.6 1.14
161.4 1.14
163.3 1.15
165.1 1.15
167 1.17
168.9 1.17
170.7 1.18
172.6 1.19
174.4 1.19
176.3 1.21
178.1 1.21
180 1.23
181.9 1.23
183.7 1.25
185.6 1.25
187.4 1.26
189.3 1.27
191.1 1.28
193 1.29
194.9 1.3
196.7 1.3
198.6 1.3
200.4 1.31
202.3 1.32
204.1 1.33
206 1.34
207.9 1.34
209.7 1.35
211.6 1.36
213.4 1.37
215.3 1.37
217.2 1.38
219 1.39
220.9 1.39
222.7 1.4
224.6 1.41
226.4 1.41
228.3 1.42
230.2 1.43
232 1.43
233.9 1.43
235.7 1.45
237.6 1.46
239.4 1.46
241.3 1.47
243.2 1.49
245 1.49
246.9 1.48
248.7 1.49
250.6 1.5
252.4 1.5
254.3 1.51
256.2 1.51
258 1.53
259.9 1.53
261.7 1.54
263.6 1.54
265.4 1.55
267.3 1.55
269.2 1.55
271 1.56
272.9 1.57
Measurement Method: Resistivity (4-probe)
Test facility: Hitachi Research Laboratory, Hitachi, Ltd. Location: Central Lab., Hitachi Kenkyu-syo Start date: 3/13/94 Weekday: Monday Start time: 8:10 End date: 3/17/94 Eeekday: Friday End time: 20:00 Environment temperature (max): 20 °C Environment humidity (max): 60 % Laboratory environment: air conditioned Test equipment: DVM; personal computer; printer; power source Specimen shape: thin film Specimen width: 2.2 mm Specimen thickness: 1.1 mm Material of current electrode: indium ultrasonic wave solder Distance between current electrodes: 9.5 mm Material of voltage electrode: Ag paste (110 °C, 10 min drying) Specimen treatment: being cut using a dry diamond cutter Electrode: Cu wire Test environment: He Applied current (avg): 10 mA Cooling rate (avg): 250 K/h Data definition: onset Data definition: middle point Data definition: zero resistance temperature

Cautions: Research Data
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.6
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BMK66Y
Production Form:

Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Temperature (K) Resistivity (normal state) (mΩ·cm)
50.8 0.03
52.8 0.1
54.8 0.34
56.8 0.75
58.8 1.04
60.8 1.32
62.8 1.48
64.8 1.6
66.8 1.68
68.8 1.73
70.8 1.75
72.8 1.8
74.8 1.82
76.8 1.85
78.8 1.88
80.8 1.88
82.8 1.89
84.8 1.9
86.8 1.91
88.7 1.91
90.7 1.93
92.7 1.93
94.7 1.94
96.7 1.95
98.7 1.97
100.7 1.98
102.7 1.99
104.7 2
106.7 2.02
108.7 2.02
110.7 2.03
112.7 2.04
114.7 2.05
116.7 2.06
118.7 2.07
120.7 2.09
122.7 2.09
124.6 2.11
126.6 2.12
128.6 2.13
130.6 2.14
132.6 2.14
134.6 2.16
136.6 2.17
138.6 2.17
140.6 2.18
142.6 2.2
144.6 2.21
146.6 2.23
148.6 2.23
150.6 2.24
152.6 2.25
154.6 2.25
156.6 2.26
158.6 2.27
160.5 2.29
162.5 2.31
164.5 2.32
166.5 2.33
168.5 2.35
170.5 2.35
172.5 2.37
174.5 2.39
176.5 2.4
178.5 2.41
180.5 2.43
182.5 2.43
184.5 2.45
186.5 2.46
188.5 2.48
190.5 2.5
192.5 2.5
194.5 2.53
196.5 2.54
198.4 2.54
200.4 2.54
202.4 2.55
204.4 2.57
206.4 2.58
208.4 2.59
210.4 2.6
212.4 2.6
214.4 2.62
216.4 2.63
218.4 2.64
220.4 2.66
222.4 2.67
224.4 2.67
226.4 2.67
228.4 2.67
230.4 2.68
232.4 2.71
234.3 2.71
236.3 2.72
238.3 2.72
240.3 2.74
242.3 2.74
244.3 2.76
246.3 2.77
248.3 2.76
Measurement Method: Resistivity (4-probe)
Test facility: Hitachi Research Laboratory, Hitachi, Ltd. Location: Central Lab., Hitachi Kenkyu-syo Start date: 3/13/94 Weekday: Monday Start time: 8:10 End date: 3/17/94 Eeekday: Friday End time: 20:00 Environment temperature (max): 20 °C Environment humidity (max): 60 % Laboratory environment: air conditioned Test equipment: DVM; personal computer; printer; power source Specimen shape: thin film Specimen width: 2.2 mm Specimen thickness: 1.1 mm Material of current electrode: indium ultrasonic wave solder Distance between current electrodes: 9.5 mm Material of voltage electrode: Ag paste (110 °C, 10 min drying) Specimen treatment: being cut using a dry diamond cutter Electrode: Cu wire Test environment: He Applied current (avg): 10 mA Cooling rate (avg): 250 K/h Data definition: onset Data definition: middle point Data definition: zero resistance temperature

Cautions: Research Data