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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Resistance-temperature characteristics for (Tc) and Jc (70K)
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1091,1092,1096
Keywords: Material Specification, Resistance (normal state)

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3Oz
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: FMAY-3
Production Form:
Resistance (normal state) for Y:123; [Y-Ba-Cu-O]
Case Number () Temperature (K) Resistance (normal state) (mΩ)
1 74.26 119
1 73.84 272
1 74.69 595
1 75.13 938
1 75.56 139
1 76.00 179
1 77.07 223
1 77.72 257
1 78.58 290
1 79.01 316
1 79.66 345
1 80.3 364
1 80.94 387
1 81.37 402
1 81.8 425
1 82.66 438
1 83.09 455
1 83.94 469
1 84.58 488
1 85.86 499
1 87.78 505
1 92.89 524
1 103.5 565
1 109.9 580
1 112.5 582
1 114.6 588
1 121.2 603
1 124.8 614
1 133.1 633
1 143.3 658
1 168.0 724
1 197.0 796
1 229.8 888
1 243.0 919
1 250.2 939
1 276.8 101
2 46.83 94.29
2 54.75 51.60
2 57.97 94.25
2 62.89 58.28
2 73.6 34.28
2 74.24 32.84
2 78.32 98.5
2 78.78 297
2 79.49 719
2 80.0 122
2 80.3 174
2 81.04 231
2 81.97 276
2 82.05 323
2 82.55 366
2 83.25 400
2 83.95 433
2 84.64 462
2 84.89 485
2 85.57 510
2 86.23 522
2 87.13 544
2 87.6 569
2 89.76 583
2 94.51 605
2 97.1 614
2 100.3 633
2 104.2 647
2 111.6 678
2 117.4 702
2 121.2 706
2 127.5 727
2 132.0 743
2 143.2 783
2 150.1 809
2 154.0 818
2 160.9 844
2 162.3 797
2 163.0 854
2 165.8 858
2 168.6 867
2 171.9 874
2 173.6 886
2 176.2 891
2 177.5 893
2 180.3 907
2 187.6 931
2 189.1 938
2 191.5 950
2 194.6 899
2 193.4 952
2 195.6 956
2 197.5 963
2 199.9 965
2 200.9 970
2 203.5 982
2 205.7 989
2 210.2 101
2 213.9 101
2 215.8 102
2 219.5 104
2 223.8 105
2 228.5 106
2 233.0 108
2 238.0 110
2 244.9 112
2 249.4 114
2 251.6 114
2 253.1 114
2 255.0 116
2 256.9 115
2 258.7 116
2 260.6 117
2 262.5 117
2 264.3 120
2 265.8 119
2 267.7 119
2 269.0 119
2 269.2 119
2 271.2 121
Measurement Method: Resistivity (DC 4-probe)
Test facility: 2nd Lab., Research Dept., Yokohama Kenkyu-syo Location: Rm. 5107, Yokohama Kenkyu-syo Start date: 4/14/94 Weekday: Friday Start time: 15:00 End date: 4/14/94 Weekday: Friday End time: 20:00 Environment temperature (avg): 25 °C Environment humidity (avg): 80 % Laboratory environment: air conditioned Test equipment (1): X-ray diffractometer Model of test equipment (1): CN2013 Maker of test equipment (1): Rigaku Denki Test equipment (2): electrode maker Model of test equipment (2): SVC-700 Maker of test equipment (2): Sanyo Electronic Test equipment (3): thermocouple Maker of test equipment (3): Iwatani Kuraio Model of test equipment (3): TCU-3 Remark on test equipment (3): Au-Fe·Cr thermocouple Test equipment (4): P-T Maker of test equipment (4): Taylor-Hobson Model of test equipment (4): TARI STEP Remark on test equipment (4): for measurement of film thickness Specimen shape: sputtered film Specimen treatment: cutting a rectangle piece with a width of 2mm from the large sample after X-ray diffraction test, evaporating Au electrode onto it and pressing with In Data comment: measured Rho-T curve

Cautions: Research Data