NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: measurement of Tc and Jc
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1162
Keywords: Material Specification, Critical Temperature, Critical Current Density

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3Ox
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: FNTY3
Production Form: Thin Film
Critical Temperature for Y:123; [Y-Ba-Cu-O]
Critical Temperature (K)
86.6
Measurement Method: Resistivity (4-probe)
Test facility: Osaka Kenkyu-syo, Sumitomo Denko Location: Bldg. 5 Start date: 2/20/94 End date: 2/20/94 Environment temperature (avg): 18 °C Environment humidity (avg): 45 % Laboratory environment: air conditioned Test equipment (1): power source for Tc and Ic measurement Maker of test equipment (1): Advantest Model of test equipment (1): DC VOLTAGE CURRENT SOURCE/MONITOR TR6143 Test equipment (2): voltmeter Maker of test equipment (2): Keithley Model of test equipment (2): 196 SYSTEM DMM Remark on test condition: set a bridge on thin film for Tc, Ic measurement; bridge thicknes: 0.322 µm, bridge width: 42.4 µm, bridge length: 250 µm Data comment: defining the current which induces 1µV within 1 cm as Ic

Cautions: Research Data
Critical Current Density for Y:123; [Y-Ba-Cu-O]
Critical Current Density (kA/cm2)
747
Measurement Method: Resistivity (4-probe)
Test facility: Osaka Kenkyu-syo, Sumitomo Denko Location: Bldg. 5 Start date: 2/20/94 End date: 2/20/94 Environment temperature (avg): 18 °C Environment humidity (avg): 45 % Laboratory environment: air conditioned Test equipment (1): power source for Tc and Ic measurement Maker of test equipment (1): Advantest Model of test equipment (1): DC VOLTAGE CURRENT SOURCE/MONITOR TR6143 Test equipment (2): voltmeter Maker of test equipment (2): Keithley Model of test equipment (2): 196 SYSTEM DMM Remark on test condition: set a bridge on thin film for Tc, Ic measurement; bridge thicknes: 0.322 µm, bridge width: 42.4 µm, bridge length: 250 µm Data comment: defining the current which induces 1µV within 1 cm as Ic

Cautions: Research Data