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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Jc of wire sample
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1183
Keywords: Material Specification, Critical Current Density

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3Ox
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: TFRY
Production Form: Tape

Critical Current Density for Y:123; [Y-Ba-Cu-O]
Critical Current Density (kA/cm2)
0.341
Measurement Method: Resistivity (DC 4-probe)
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: Rm. 220, Chyuo Kenkyu-syo Start date: 3/8/94 End date: 3/8/94 Environment temperature (avg): 22 °C Environment humidity (avg): 60 % Test equipment (1): Ic measurement equipment Maker of test equipment (1): Heiwa Denki Remark on test equipment (1): output current: 0-500 A, output voltage: 0-7 V, sweeping rate: 1-1000 s arbitrary set up, monitor output: 0-10 V (corresponding to 0-500 A) Test equipment (2): X-Y recorder Maker of test equipment (2): Yokokawa Denki Remark on test equipment (2): resolution: 5 µV/cm Specimen holding: putting copper electrodes on an epoxy glass holder, fixing the wire specimen on the holder by soldering Test environment: liquid N2 Sweep rate: 1 A/s Data comment: defining the current which induced 1µV/cm voltage between the voltage electrodes as Ic, Jc = Ic/S, S: cross section area of the bulk sample (measured using a micrometer)

Cautions: Research Data
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3Ox
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: TFJY
Production Form: Tape

Critical Current Density for Y:123; [Y-Ba-Cu-O]
Critical Current Density (kA/cm2)
0.236
Measurement Method: Resistivity (DC 4-probe)
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: Rm. 220, Chyuo Kenkyu-syo Start date: 3/8/94 End date: 3/8/94 Environment temperature (avg): 22 °C Environment humidity (avg): 60 % Test equipment (1): Ic measurement equipment Maker of test equipment (1): Heiwa Denki Remark on test equipment (1): output current: 0-500 A, output voltage: 0-7 V, sweeping rate: 1-1000 s arbitrary set up, monitor output: 0-10 V (corresponding to 0-500 A) Test equipment (2): X-Y recorder Maker of test equipment (2): Yokokawa Denki Remark on test equipment (2): resolution: 5 µV/cm Specimen holding: putting copper electrodes on an epoxy glass holder, fixing the wire specimen on the holder by soldering Test environment: liquid N2 Sweep rate: 1 A/s Data comment: defining the current which induced 1µV/cm voltage between the voltage electrodes as Ic, Jc = Ic/S, S: cross section area of the bulk sample (measured using a micrometer)

Cautions: Research Data