NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Jc of YBCO thin film
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1185
Keywords: Material Specification, Critical Current Density

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3Ox
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: FMAY-4
Production Form: Thin Film
Critical Current Density for Y:123; [Y-Ba-Cu-O]
Critical Current Density (kA/cm2)
620
Measurement Method: Resistivity
Test facility: Chyuo Kenkyu-syo, Mitsubishi Material Location: Main Building: 14, Chyo Kenkyu-syo Start date: 5/10/94 End date: 5/10/94 Environment temperature (avg): 24 °C Environment humidity (avg): 60 % Laboratory environment: air conditioned Test equipment (1): Ic test equipment, function generator Model of test equipment (1): HP8116A Test equipment (2): Ic test equipment, power amplifier Model of test equipment (2): NF·4010 Test equipment (3): Ic measurement equipment, XY recorder Specimen history: stored in desiccator Specimen size - width of thin film: 1 mm Specimen size - length of thin film: 7 mm Test environment: liquid N2 Test temperature (avg): 4.2 K Remark on test condition: sweeping current at 3 MHz to 100 MHz frequency, making electrodes by pressing a wire on 1 µm sputtered Au film with indium Data comment: defining the current which induced 1 µV/cm voltage between the voltage electrodes as Ic, Jc = Ic/S, S: cross section area of the bulk sample

Cautions: Research Data