Material Specification for Y:123; [Y-Ba-Cu-O]
Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BSD69Yüi1üj
Production Form: Disk
Critical Current Density for Y:123; [Y-Ba-Cu-O]
Critical Current Density (kA/cm2) |
0.038 |
Measurement Method: Resistivity
Test facility: Toshiba Sogo Kenkyu-syo, Toshiba Energy-Kiki Kenkyu-syo
Location: laboratory
Start date: 2/3/94
End date: 2/3/94
Laboratory environment: air conditioned
Test equipment: stainless dewar (150 mm diameter), 30 A power source, sweeper, recorder
Maker of test equipment: Yokokawa Denki
Specimen history: putting in a desiccator which containing silicagel
Specimen size - width of thin film: 2.1 mm
Specimen size - length of thin film: 20 mm
Specimen size - thickness of thin film (avg): 0.8 mm
Remark on specimen: cutting the sample with a diamond cutter, attaching four probes by ultrasonic soldering
Distance between current electrodes: 18 mm
Distance between voltage electrode: 5.5 mm
Specimen pre-treatment: no special
Test environment: liquid N2
Test temperature (avg): 77.3 K
Sweep rate: 0.3 A/s
Remark on test condition: measuring Ic at 77.3 K, 0 T, and air environment, soaking the probe attached with the specimen in liquid N2 cryostat, obtaining I-V curve by 4-probe method, current sweep rate: 0.3 A/s.
Data derivation method: I-V curve from recorder
Data comment: non-superconducting (Ic < 10 mA), Ic: the current which induces 1 µV/cm between voltage probes, Jc = Ic/S, S: cross section area of bulk sample, S = 1.68 mm
2
Cautions: Research Data