NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Jc measurement
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1232
Keywords: Material Specification, Resistivity (normal state)

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.6
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BSD66Yüi3üj
Production Form: Disk

Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Resistivity (normal state) (mΩ·cm)
0.31
Measurement Method: Resistivity
Test facility: Toshiba Sogo Kenkyu-syo, Toshiba Energy-Kiki Kenkyu-syo Location: laboratory Start date: 2/3/94 End date: 2/3/94 Laboratory environment: air conditioned Test equipment: stainless dewar (150 mm diameter), 30 A power source, sweeper, recorder Maker of test equipment: Yokokawa Denki Specimen history: putting in a desiccator which containing silica gel Specimen size - width of thin film: 2 mm Specimen size - length of thin film: 20 mm Specimen size - thickness of thin film (avg): 0.9 mm Remark on specimen: cut with a diamond cutter, four probes attached by ultrasonic soldering Distance between current electrodes: 17 mm Distance between voltage electrode: 5 mm Specimen pre-treatment: no special Test environment: liquid N2 Test temperature (avg): 77.3 K Applied field (avg): 0 T Remark on test condition: measuring Ic in air; soaking the probe attached with sample into a liquid N2 cryostat; measuring I-V curve with 4-probe method Current sweeping rate: 0.3 A/s; recording probe voltage with a recorder Data derivation method: I-V curve from recorder Data comment: non-superconducting (Ic < 10 mA), Ic: the current which induces 1 µV/cm between voltage probes, Jc = Ic/S, S: cross section area of bulk sample, S = 1.8 mm2

Cautions: Research Data