NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Jc measurement
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1238
Keywords: Material Specification, Resistivity (normal state)

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.6
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BDK66Yüi2üj
Production Form: Disk
Resistivity (normal state) for Y:123; [Y-Ba-Cu-O]
Resistivity (normal state) (mΩ·cm)
310
Measurement Method: Resistivity (4-probe)
Test facility: Toshiba Energy-Kiki Kenkyu-syo Location: laboratory Start date: 1/12/94 End date: 1/12/94 Laboratory environment: air conditioned Test equipment: stainless dewar (150 mm diameter), 30 A power source, sweeper, recorder Maker of test equipment: Yokokawa Denki Specimen history: putting in a desiccator which containing silica gel Specimen size - width of thin film: 2.2 mm Specimen size - length of thin film: 14 mm Specimen size - thickness of thin film (avg): 1.7 mm Remark on specimen: cut with a diamond cutter, four probes attached by ultrasonic soldering Distance between current electrodes: 12 mm Distance between voltage electrode: 4 mm Specimen pre-treatment: no special Test environment: liquid N2 Test temperature (avg): 77.3 K Sweep rate: 30/100 A/s Applied field (avg): 0 T Test environment: air Remark on test condition: sample current increased at 30 A per 100 s sweeping rate, measured and recorded the induced voltage, attached sample to a probe (to avoid the influence of thermal deformation) and soaked it to liquid N2 Data derivation method: I-V curve from recorder Data comment (1): defining the current which induced 1 µV/cm voltage between the voltage electrodes as Ic, Jc = Ic/S, S: cross section area of the bulk sample, S= 3.74 mm2 Data comment (2): measured at 77.3 K, 0 T

Cautions: Research Data