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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: M-T characteristic of MOCVD YBCO thin film
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1308
Keywords: Material Specification, Critical Temperature, Critical Current Density

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3Ox
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: FRIY-6
Production Form: Thin Film

Critical Temperature for Y:123; [Y-Ba-Cu-O]
Critical Temperature (K)
83
Measurement Method: SQUID
Test facility: Denshi Gijyutsu Sogo Kenkyu-syo Location: Rm. 124, Cryogenic Center 2, Electrotechnical Laboratory Start date: 2/15/94 End date: 2/16/94 Environment temperature (avg): 20 °C Laboratory environment: air conditioned Test equipment: SQUID Maker of test equipment: Quantum Design Model of test equipment: Magnetic Property Measurement System Other test equipment: gas flowing temperature control system Test condition: measuring magnetization with sample moving Specimen shape: thin film Specimen size - length of thin film: 1.7 mm Specimen size - thickness of thin film (avg): 0.5 µm Specimen size - thickness of thin film (max): 0.7 µm Specimen size: cross section area of thin film: 1.65 mm2 Specimen pre-treatment: fixed in CVD quarts holder (field perpendicular to film) Test temperature: 10 K to 120 K (for Tc measurement), 77K and 10 K (for Jc measurement) Remark on test condition: after applying 796 A/m (10 Oe) (ZFC, FC) and 15.9 kA/m (200 Oe) fields, measuring remanent moment at zero external field Data comment (1): Tc: magnetization onset Data comment (2): Jc: calculating by Bean model Jc = 30 M/R, Jc(Ncm2), M(emu/cm2), R(cm), film thickness 0.6 µm

Cautions: Research Data
Critical Current Density for Y:123; [Y-Ba-Cu-O]
Temperature (K) Critical Current Density (kA/cm2)
77 86
10 450
Measurement Method: SQUID
Test facility: Denshi Gijyutsu Sogo Kenkyu-syo Location: Rm. 124, Cryogenic Center 2, Electrotechnical Laboratory Start date: 2/15/94 End date: 2/16/94 Environment temperature (avg): 20 °C Laboratory environment: air conditioned Test equipment: SQUID Maker of test equipment: Quantum Design Model of test equipment: Magnetic Property Measurement System Other test equipment: gas flowing temperature control system Test condition: measuring magnetization with sample moving Specimen shape: thin film Specimen size - length of thin film: 1.7 mm Specimen size - thickness of thin film (avg): 0.5 µm Specimen size - thickness of thin film (max): 0.7 µm Specimen size: cross section area of thin film: 1.65 mm2 Specimen pre-treatment: fixed in CVD quarts holder (field perpendicular to film) Test temperature: 10 K to 120 K (for Tc measurement), 77K and 10 K (for Jc measurement) Remark on test condition: after applying 796 A/m (10 Oe) (ZFC, FC) and 15.9 kA/m (200 Oe) fields, measuring remanent moment at zero external field Data comment (1): Tc: magnetization onset Data comment (2): Jc: calculating by Bean model Jc = 30 M/R, Jc(Ncm2), M(emu/cm2), R(cm), film thickness 0.6 µm

Cautions: Research Data