NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1389,1402
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.6
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BSD66Y
Production Form:

Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
17.7 200
18.3 200
18.8 230
19.3 220
19.8 240
20.3 220
20.8 220
21.3 220
21.8 210
22.4 240
22.9 220
23.4 230
23.9 220
24.4 220
24.9 240
25.4 220
25.9 240
26.5 220
27.0 270
27.5 290
28.0 240
28.5 260
29.0 270
29.5 270
30.0 280
30.6 270
31.1 290
31.6 270
32.1 290
32.6 290
33.1 300
33.6 270
34.1 310
34.7 320
35.2 310
35.7 290
36.2 330
36.7 330
37.2 360
37.7 340
38.2 370
38.8 360
39.3 360
39.8 350
40.3 360
40.8 380
41.3 390
41.8 380
42.4 420
42.9 410
43.4 430
43.9 420
44.4 440
44.9 420
45.4 440
45.9 440
46.5 450
47.0 480
47.5 490
48.0 500
48.5 510
49.0 510
49.5 520
50.0 540
50.6 580
51.1 640
51.6 640
52.1 680
52.6 730
53.1 730
53.6 750
54.1 890
54.7 840
55.2 920
55.7 960
56.2 990
56.7 1020
57.2 1040
57.7 1070
58.2 1110
58.8 1110
59.3 1130
59.8 1130
60.3 1150
60.8 1170
61.3 1200
61.8 1200
62.3 1240
62.9 1240
63.4 1270
63.9 1270
64.4 1290
64.9 1290
65.4 1270
65.9 1290
66.4 1320
67.0 1330
67.5 1320
68.0 1340
68.5 1330
69.0 1360
69.5 1400
70.0 1400
70.6 1380
71.1 1410
71.6 1430
72.1 1450
72.6 1460
73.1 1460
73.6 1470
74.1 1440
74.7 1430
75.2 1460
75.7 1480
76.2 1470
76.7 1490
77.2 1470
77.7 1460
78.2 1470
78.8 1440
79.3 1470
79.8 1460
80.3 1440
80.8 1470
81.3 1440
81.8 1470
82.3 1470
82.9 1480
83.4 1510
83.9 1500
84.4 1470
84.9 1490
85.4 1490
85.9 1490
86.4 1480
87.0 1510
87.5 1470
88.0 1490
88.5 1490
89.0 1500
89.5 1500
90.0 1490
90.5 1490
91.1 1490
91.6 1510
92.1 1510
92.6 1510
93.1 1510
93.6 1510
94.1 1510
94.6 1530
95.2 1510
95.7 1510
96.2 1510
96.7 1530
97.2 1510
97.7 1520
98.2 1510
98.8 1530
99.3 1520
99.8 1540
100.3 1530
100.8 1520
101.3 1530
101.8 1530
102.3 1530
102.9 1530
103.4 1530
103.9 1560
104.4 1560
104.9 1580
105.4 1530
105.9 1530
106.4 1530
107.0 1550
107.5 1530
108.0 1560
108.5 1530
109.0 1560
109.5 1530
110.0 1550
110.5 1530
111.1 1560
111.6 1560
112.1 1570
112.6 1560
113.1 1560
113.6 1560
114.1 1580
114.6 1580
115.2 1570
115.7 1560
116.2 1560
116.7 1580
117.2 1580
117.7 1590
118.2 1580
118.7 1600
119.3 1580
119.8 1600
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 5/31/90 Weekday: Thursday Start time: 15:28 End date: 6/1/90 Weekday: Friday End time: 9:30 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity Remark on data: floppy format HP basic LIF

Cautions: Research Data