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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1390,1402
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BSD69Y
Production Form:
Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
18.0 50
18.5 110
19.0 30
19.5 50
20.0 70
20.5 80
21.0 110
21.6 60
22.1 90
22.6 70
23.1 90
23.6 50
24.1 70
24.6 50
25.1 50
25.6 60
26.2 50
26.7 60
27.2 60
27.7 70
28.2 130
28.7 20
29.2 30
29.7 90
30.2 130
30.8 70
31.3 70
31.8 70
32.3 140
32.8 70
33.3 70
33.8 80
34.3 70
34.9 50
35.4 50
35.9 50
36.4 110
36.9 70
37.4 140
37.9 70
38.4 80
38.9 70
39.5 70
40.0 70
40.5 70
41.0 80
41.5 140
42.0 70
42.5 70
43.0 70
43.6 70
44.1 60
44.6 150
45.1 70
45.6 90
46.1 80
46.6 70
47.1 90
47.6 90
48.2 110
48.7 70
49.2 90
49.7 90
50.2 90
50.7 60
51.2 70
51.7 90
52.2 70
52.8 110
53.3 150
53.8 100
54.3 160
54.8 90
55.3 90
55.8 80
56.3 140
56.9 90
57.4 80
57.9 90
58.4 90
58.9 90
59.4 90
59.9 90
60.4 120
60.9 100
61.5 30
62.0 120
62.5 130
63.0 110
63.5 150
64.0 90
64.5 90
65.0 110
65.6 130
66.1 130
66.6 110
67.1 100
67.6 120
68.1 140
68.6 140
69.1 90
69.6 180
70.2 130
70.7 180
71.2 110
71.7 110
72.2 110
72.7 140
73.2 140
73.7 180
74.2 170
74.8 200
75.3 140
75.8 110
76.3 120
76.8 120
77.3 140
77.8 140
78.3 150
78.9 160
79.4 180
79.9 160
80.4 170
80.9 170
81.4 160
81.9 250
82.4 200
82.9 230
83.5 200
84.0 240
84.5 250
85.0 290
85.5 270
86.0 300
86.5 310
87.0 340
87.5 340
88.1 450
88.6 480
89.1 560
89.6 620
90.1 760
90.6 830
91.1 920
91.6 1030
92.2 1060
92.7 1100
93.2 1100
93.7 1110
94.2 1110
94.7 1120
95.2 1120
95.7 1090
96.2 1140
96.8 1140
97.3 1140
97.8 1120
98.3 1120
98.8 1120
99.3 1130
99.8 1120
100.3 1210
100.9 1150
101.4 1200
101.9 1140
102.4 1190
102.9 1170
103.4 1140
103.9 1150
104.4 1160
104.9 1160
105.5 1160
106.0 1160
106.5 1180
107.0 1160
107.5 1180
108.0 1160
108.5 1170
109.0 1230
109.5 1180
110.1 1230
110.6 1180
111.1 1230
111.6 1160
112.1 1180
112.6 1200
113.1 1230
113.6 1220
114.2 1250
114.7 1230
115.2 1210
115.7 1210
116.2 1210
116.7 1210
117.2 1180
117.7 1230
118.2 1210
118.8 1220
119.3 1150
119.8 1210
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 6/1/90 Weekday: Friday Start time: 19:28 End date: 6/2/90 Weekday: Saturday End time: 11:35 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity Remark on data: floppy format HP basic LIF

Cautions: Research Data