NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1391,1403
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.4
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BDK64Y
Production Form:
Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
17.8 5730
18.3 5740
18.8 5770
19.3 5770
19.8 5790
20.3 5820
20.9 5840
21.4 5890
21.9 5880
22.4 5920
22.9 5990
23.4 5970
23.9 6040
24.4 6020
25 6070
25.5 6070
26 6080
26.5 6090
27 6090
27.5 6080
28 6110
28.5 6130
29.1 6130
29.6 6130
30.1 6140
30.6 6140
31.1 6220
31.6 6170
32.1 6160
32.6 6150
33.2 6150
33.7 6200
34.2 6170
34.7 6170
35.2 6170
35.7 6160
36.2 6170
36.7 6170
37.3 6170
37.8 6170
38.3 6170
38.8 6190
39.3 6180
39.8 6170
40.3 6170
40.8 6170
41.4 6200
41.9 6200
42.4 6220
42.9 6220
43.4 6200
43.9 6200
44.4 6200
44.9 6200
45.5 6200
46 6170
46.5 6170
47 6150
47.5 6170
48 6150
48.5 6170
49 6170
49.6 6170
50.1 6170
50.6 6170
51.1 6170
51.6 6170
52.1 6170
52.6 6150
53.1 6150
53.7 6140
54.2 6130
54.7 6150
55.2 6200
55.7 6130
56.2 6150
56.7 6110
57.2 6100
57.8 6110
58.3 6120
58.8 6110
59.3 6070
59.8 6060
60.3 6070
60.8 6060
61.3 6020
61.9 6020
62.4 6010
62.9 6020
63.4 6000
63.9 6020
64.4 5990
64.9 6040
65.4 6010
66 5970
66.5 5950
67 5950
67.5 5950
68 5950
68.5 5910
69 5890
69.5 5880
70.1 5880
70.6 5880
71.1 5880
71.6 5860
72.1 5910
72.6 5840
73.1 5840
73.6 5820
74.2 5820
74.7 5840
75.2 5790
75.7 5770
76.2 5790
76.7 5750
77.2 5750
77.7 5730
78.3 5730
78.8 5730
79.3 5740
79.8 5700
80.3 5700
80.8 5680
81.3 5700
81.9 5660
82.4 5660
82.9 5660
83.4 5660
83.9 5660
84.4 5640
84.9 5660
85.4 5640
86 5620
86.5 5610
87 5590
87.5 5530
88 5570
88.5 5590
89 5570
89.5 5570
90.1 5570
90.6 5570
91.1 5530
91.6 5590
92.1 5550
92.6 5530
93.1 5520
93.6 5460
94.2 5500
94.7 5460
95.2 5490
95.7 5480
96.2 5460
96.7 5480
97.2 5440
97.7 5450
98.3 5440
98.8 5420
99.3 5410
99.8 5370
100.3 5390
100.8 5380
101.3 5390
101.8 5370
102.4 5370
102.9 5390
103.4 5360
103.9 5320
104.4 5320
104.9 5280
105.4 5300
105.9 5290
106.5 5280
107 5280
107.5 5240
108 5230
108.5 5230
109 5230
109.5 5280
110 5210
110.6 5210
111.1 5190
111.6 5190
112.1 5190
112.6 5190
113.1 5190
113.6 5180
114.1 5200
114.7 5150
115.2 5170
115.7 5170
116.2 5130
116.7 5120
117.2 5100
117.7 5100
118.2 5120
118.8 5100
119.3 5070
119.8 5060
Measurement Method: Resistivity
test facility: Faculty of Engineering, the University of Tokyo location: Rm. 015, Bldg. 6, Faculty of Engineering start date: 5/14/90 weekday: Monday start time: 23:25 end date: 5/15/90 weekday: Tuesday end time: 19:28 test equipment (1): synthesized sweeper model of test equipment (1): HP8340B test equipment (2): scalar network analyzer model of test equipment (2): HP8757C test equipment (3): cryostat maker of test equipment (3): self-made test equipment (4): cavity resonator model of test equipment (4): TE112 specimen shape: disk specimen size: diameter: 5 mm, thickness: 0.2 mm specimen holding: being put at the bottom of the cavity test environment: thin He gas test temperature: 20 ΓΌ` 300 K remark on test: measuring the blank temperature variation separately data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) data comment: measuring Q value - resonance wave number, calculating surface resistivity remark on data: floppy format HP basic LIF

Cautions: Research Data