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NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J

Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1393,1403
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BDK69Y
Production Form:

Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
17.9 110
18.4 80
19.0 30
19.5 70
20.0 100
20.5 90
21.0 110
21.5 100
22.0 90
22.5 70
23.0 90
23.6 50
24.1 70
24.6 70
25.1 80
25.6 80
26.1 70
26.6 80
27.1 80
27.7 90
28.2 140
28.7 30
29.2 60
29.7 120
30.2 130
30.7 70
31.2 70
31.7 70
32.3 140
32.8 70
33.3 70
33.8 80
34.3 70
34.8 70
35.3 70
35.8 70
36.4 140
36.9 90
37.4 160
37.9 100
38.4 90
38.9 70
39.4 70
39.9 70
40.4 70
41.0 70
41.5 140
42.0 70
42.5 70
43.0 70
43.5 100
44.0 70
44.5 160
45.1 70
45.6 130
46.1 90
46.6 90
47.1 110
47.6 110
48.1 110
48.6 70
49.1 90
49.7 90
50.2 90
50.7 90
51.2 80
51.7 90
52.2 70
52.7 120
53.2 140
53.8 110
54.3 150
54.8 90
55.3 110
55.8 120
56.3 140
56.8 110
57.3 70
57.8 90
58.4 90
58.9 90
59.4 90
59.9 100
60.4 130
60.9 80
61.4 60
61.9 150
62.5 110
63.0 130
63.5 140
64.0 90
64.5 110
65.0 110
65.5 140
66.0 110
66.5 110
67.1 110
67.6 130
68.1 150
68.6 100
69.1 100
69.6 160
70.1 150
70.6 180
71.2 130
71.7 130
72.2 140
72.7 140
73.2 180
73.7 160
74.2 170
74.7 150
75.2 130
75.8 130
76.3 110
76.8 130
77.3 140
77.8 150
78.3 160
78.8 180
79.3 180
79.9 190
80.4 180
80.9 160
81.4 170
81.9 250
82.4 190
82.9 230
83.4 180
84.0 250
84.5 250
85.0 270
85.5 250
86.0 280
86.5 280
87.0 380
87.5 310
88.0 450
88.6 520
89.1 570
89.6 700
90.1 740
90.6 890
91.1 930
91.6 1050
92.1 1040
92.7 1090
93.2 1150
93.7 1120
94.2 1120
94.7 1110
95.2 1090
95.7 1070
96.2 1120
96.7 1140
97.3 1120
97.8 1140
98.3 1120
98.8 1120
99.3 1140
99.8 1120
100.3 1210
100.8 1140
101.4 1190
101.9 1140
102.4 1150
102.9 1130
103.4 1120
103.9 1140
104.4 1140
104.9 1160
105.4 1160
106.0 1150
106.5 1160
107.0 1160
107.5 1130
108.0 1140
108.5 1130
109.0 1120
109.5 1140
110.1 1100
110.6 1140
111.1 1130
111.6 1140
112.1 1150
112.6 1160
113.1 1140
113.6 1160
114.1 1090
114.7 1160
115.2 1160
115.7 1160
116.2 1180
116.7 1180
117.2 1150
117.7 1150
118.2 1120
118.8 1180
119.3 1140
119.8 1180
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 5/17/90 Weekday: Thursday Start time: 13:37 End date: 5/17/90 Weekday: Thursday End time: 22:05 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity remark on data: floppy format HP basic LIF

Cautions: Research Data