NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1394,1400
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.4
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BMK64Y
Production Form:
Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
18.3 1670
19.4 1730
20.4 1770
21.4 1820
22.4 1890
23.5 1980
24.5 2070
25.5 2140
26.5 2230
27.6 2320
28.6 2430
29.6 2540
30.6 2600
31.7 2730
32.7 2880
33.7 2970
34.7 3080
35.8 3190
36.8 3310
37.8 3420
38.8 3500
39.9 3570
40.9 3660
41.9 3730
42.9 3730
44.0 3750
45.0 3750
46.0 3770
47.0 3770
48.1 3770
49.1 3750
50.1 3770
51.1 3760
52.2 3750
53.2 3750
54.2 3750
55.2 3750
56.3 3750
57.3 3750
58.3 3750
59.3 3730
60.3 3730
61.4 3750
62.4 3730
63.4 3730
64.4 3720
65.5 3690
66.5 3680
67.5 3680
68.5 3680
69.6 3680
70.6 3660
71.6 3640
72.6 3620
73.7 3620
74.7 3620
75.7 3620
76.7 3610
77.8 3620
78.8 3620
79.8 3590
80.8 3590
81.9 3590
82.9 3620
83.9 3590
84.9 3570
86.0 3570
87.0 3580
88.0 3570
89.0 3570
90.1 3550
91.1 3570
92.1 3550
93.1 3550
94.2 3530
95.2 3550
96.2 3530
97.2 3550
98.3 3530
99.3 3530
100.3 3530
101.3 3530
102.4 3500
103.4 3500
104.4 3500
105.4 3510
106.5 3500
107.5 3500
108.5 3530
109.5 3520
110.6 3490
111.6 3500
112.6 3530
113.6 3500
114.7 3480
115.7 3480
116.7 3480
117.7 3480
118.8 3490
119.8 3480
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 6/2/90 Weekday: Saturday Start time: 13:39 End date: 6/2/90 Weekday: Saturday End time: 21:00 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity Remark on data: floppy format HP basic LIF

Cautions: Research Data