NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1395,1400
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.6
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BMK66Y
Production Form:

Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
18.2 120
19.2 120
20.2 120
21.3 90
22.3 120
23.3 120
24.3 120
25.4 120
26.4 120
27.4 120
28.5 120
29.5 120
30.5 120
31.5 120
32.6 140
33.6 140
34.6 140
35.6 160
36.7 210
37.7 210
38.7 210
39.7 210
40.8 210
41.8 280
42.8 270
43.8 290
44.9 320
45.9 340
46.9 360
47.9 410
49.0 410
50.0 480
51.0 480
52.1 560
53.1 640
54.1 720
55.1 800
56.2 860
57.2 940
58.2 980
59.2 1080
60.3 1100
61.3 1250
62.3 1300
63.3 1370
64.4 1410
65.4 1410
66.4 1420
67.4 1390
68.5 1460
69.5 1440
70.5 1440
71.6 1440
72.6 1440
73.6 1460
74.6 1460
75.7 1500
76.7 1480
77.7 1470
78.7 1480
79.8 1480
80.8 1480
81.8 1520
82.8 1500
83.9 1500
84.9 1520
85.9 1550
86.9 1530
88.0 1530
89.0 1530
90.0 1530
91.0 1530
92.1 1530
93.1 1540
94.1 1530
95.2 1550
96.2 1530
97.2 1530
98.2 1540
99.3 1550
100.3 1520
101.3 1530
102.3 1530
103.4 1520
104.4 1530
105.4 1500
106.4 1500
107.5 1510
108.5 1500
109.5 1550
110.5 1550
111.6 1530
112.6 1540
113.6 1530
114.6 1550
115.7 1530
116.7 1530
117.7 1530
118.8 1550
119.8 1550
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 4/21/90 Weekday: Saturday Start time: 9:27 End date: 4/21/90 Weekday: Saturday End time: 13:15 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity Remark on data: floppy format HP basic LIF

Cautions: Research Data