NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1396,1400
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BMK69Y
Production Form:
Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
18.1 50
19.1 50
20.2 50
21.2 30
22.2 50
23.2 50
24.3 50
25.3 50
26.3 50
27.3 80
28.4 40
29.4 50
30.4 80
31.4 70
32.5 50
33.5 50
34.5 60
35.5 70
36.6 90
37.6 100
38.6 80
39.6 80
40.7 120
41.7 70
42.7 30
43.7 50
44.8 80
45.8 10
46.8 50
47.8 80
48.9 80
49.9 80
50.9 80
51.9 100
53 100
54 100
55 80
56 110
57.1 100
58.1 120
59.1 100
60.1 120
61.2 150
62.2 130
63.2 140
64.2 190
65.3 190
66.3 170
67.3 200
68.3 230
69.4 230
70.4 220
71.4 250
72.4 290
73.4 320
74.5 340
75.5 370
76.5 370
77.5 430
78.6 390
79.6 480
80.6 500
81.6 480
82.7 510
83.7 540
84.7 580
85.7 610
86.8 610
87.8 750
88.8 860
89.8 940
90.9 1110
91.9 1220
92.9 1340
93.9 1330
95 1320
96 1420
97 1350
98 1350
99.1 1370
100.1 1420
101.1 1380
102.1 1410
103.2 1400
104.2 1410
105.2 1420
106.2 1420
107.3 1430
108.3 1420
109.3 1400
110.3 1400
111.4 1400
112.4 1440
113.4 1420
114.4 1420
115.5 1420
116.5 1420
117.5 1420
118.5 1400
119.6 1400
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 4/19/90 Weekday: Thursday Start time: 13:15 End date: 4/20/90 Weekday: Friday End time: 16:12 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity Remark on data: floppy format HP basic LIF

Cautions: Research Data